Glatzel Pieter, Harris Alistair, Marion Philippe, Sikora Marcin, Weng Tsu Chien, Guilloud Cyril, Lafuerza Sara, Rovezzi Mauro, Detlefs Blanka, Ducotté Ludovic
ESRF - The European Synchrotron, 71 Avenue des Martyres, 38000 Grenoble, France.
Design et Mécanique, Les Coings, 38210 Montaud, France.
J Synchrotron Radiat. 2021 Jan 1;28(Pt 1):362-371. doi: 10.1107/S1600577520015416.
X-ray emission spectroscopy in a point-to-point focusing geometry using instruments that employ more than one analyzer crystal poses challenges with respect to mechanical design and performance. This work discusses various options for positioning the components and provides the formulas for calculating their relative placement. Ray-tracing calculations were used to determine the geometrical contributions to the energy broadening including the source volume as given by the beam footprint on the sample. The alignment of the instrument is described and examples are given for the performance.
在使用多个分析晶体的仪器的点对点聚焦几何结构中进行X射线发射光谱分析，在机械设计和性能方面存在挑战。这项工作讨论了组件定位的各种选项，并提供了计算它们相对位置的公式。使用射线追踪计算来确定对能量展宽的几何贡献，包括由样品上的束斑给出的源体积。描述了仪器的对准情况，并给出了性能示例。
