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用于NSLS-II内壳层光谱光束线硬X射线光子入/光子出光谱分析的五分析仪约翰光谱仪:设计、对准与数据采集

Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy beamline at NSLS-II: design, alignment and data acquisition.

作者信息

Tayal Akhil, Coburn David Scott, Abel Donald, Rakitin Max, Ivashkevych Oksana, Wlodek Jakub, Wierzbicki Dominik, Xu Weihe, Nazaretski Evgeny, Stavitski Eli, Leshchev Denis

机构信息

National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA.

出版信息

J Synchrotron Radiat. 2024 Nov 1;31(Pt 6):1609-1621. doi: 10.1107/S1600577524009342. Epub 2024 Oct 30.

Abstract

Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, the spectrometer achieves a resolution in the 0.5-2 eV range, depending on the element and/or emission line, providing detailed insights into the local electronic and geometric structure of materials. It serves a diverse user community, including fields such as physical, chemical, biological, environmental and materials sciences. This article details the mechanical design, alignment procedures and data-acquisition scheme of the spectrometer, with a particular focus on the continuous asynchronous data-acquisition approach that significantly enhances experimental efficiency.

摘要

本文介绍了一台最近在国家同步辐射光源II(NSLS-II)的内壳层光谱光束线(8-ID)上投入使用的五分析器约翰光谱仪。该光谱仪专为硬X射线光子入射/光子出射光谱设计,根据元素和/或发射线的不同,其分辨率在0.5 - 2 eV范围内,能够深入了解材料的局部电子和几何结构。它服务于包括物理、化学、生物、环境和材料科学等领域在内的多样化用户群体。本文详细介绍了该光谱仪的机械设计、对准程序和数据采集方案,特别关注了显著提高实验效率的连续异步数据采集方法。

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