Milano G, D'Ortenzi L, Bejtka K, Ciubini B, Porro S, Boarino L, Ricciardi C
Advanced Materials Metrology and Life Science Division, INRiM (Istituto Nazionale di Ricerca Metrologica), Strada delle Cacce 91, I-10135, Torino, Italy.
Department of Applied Science and Technology, Politecnico di Torino, c.so Duca degli Abruzzi 24, I-10129 Torino, Italy.
Nanotechnology. 2021 Apr 30;32(18):185202. doi: 10.1088/1361-6528/abe072.
In this work, we report on the metal-insulator transition and electronic transport properties of single crystalline ZnO nanowires synthetized by means of Chemical Vapor Deposition. After evaluating the effect of adsorbed species on transport properties, the thermally activated conduction mechanism was investigated by temperature-dependent measurements in the range 81.7-250 K revealing that the electronic transport mechanism in these nanostructures is in good agreement with the presence of two thermally activated conduction channels. More importantly, it was observed that the electrical properties of ZnO NWs can be tuned from semiconducting to metallic-like as a function of temperature with a metal-to-insulator transition (MIT) observed at a critical temperature above room temperature (T ∼ 365 K). Charge density and mobility were investigated by means of field effect measurements in NW field-effect transistor configuration. Results evidenced that the peculiar electronic transport properties of ZnO NWs are related to the high intrinsic n-type doping of these nanostructures that is responsible, at room temperature, of a charge carrier density that lays just below the critical concentration for the MIT. This work shows that native defects, Coulomb interactions and surface states influenced by adsorbed species can significantly influence charge transport in NWs.
在这项工作中,我们报道了通过化学气相沉积法合成的单晶ZnO纳米线的金属-绝缘体转变和电子输运性质。在评估吸附物种对输运性质的影响之后,通过在81.7 - 250 K范围内进行的温度相关测量研究了热激活传导机制,结果表明这些纳米结构中的电子输运机制与两个热激活传导通道的存在高度吻合。更重要的是,观察到ZnO纳米线的电学性质可随温度从半导体转变为类金属,在高于室温的临界温度(T ∼ 365 K)处观察到金属-绝缘体转变(MIT)。通过在NW场效应晶体管配置下进行场效应测量研究了电荷密度和迁移率。结果表明,ZnO纳米线独特的电子输运性质与这些纳米结构的高本征n型掺杂有关,在室温下,这种掺杂导致电荷载流子密度略低于MIT的临界浓度。这项工作表明,本征缺陷、库仑相互作用以及受吸附物种影响的表面态会显著影响纳米线中的电荷输运。