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原始的以及负载TCNQ的择优生长金属有机框架薄膜中的电荷传输、电导率和塞贝克系数

Charge. transport, conductivity and Seebeck coefficient in pristine and TCNQ loaded preferentially grown metal-organic framework films.

作者信息

Chen Xin, Zhang Kai, Hassan Zeinab Mohamed, Redel Engelbert, Baumgart Helmut

机构信息

Dept. Electrical and Computer Engineering, Old Dominion University, Norfolk, VA 23529, United States of America.

Applied Research Center, Newport News, Thomas Jefferson National Accelerator Lab, Virginia 23606, United States of America.

出版信息

J Phys Condens Matter. 2022 Aug 9;34(40). doi: 10.1088/1361-648X/abe72f.

Abstract

This investigation on metal-organic framework (MOF) HUKUST-1 films focuses on comparing the undoped pristine state and with the case of doping by TCNQ infiltration of the MOF pore structure. We have determined the temperature dependent charge transport and-type conductivity for HKUST-1 films. Furthermore, the electrical conductivity and the current-voltage characteristics have been characterized in detail. Because the most common forms of MOFs, bulk MOF powders, do not lend themselves easily to electrical characterization investigations, here in this study the electrical measurements were performed on dense, compact surface-anchored metal-organic framework (SURMOF) films. These monolithic, well-defined, and (001) preferentially oriented MOF thin films are grown using quasi-liquid phase epitaxy (LPE) on specially functionalized silicon or borosilicate glass substrates. In addition to the pristine SURMOF films also the effect of loading these porous thin films with TCNQ has been investigated. Positive charge carrier conduction and a strong anisotropy in electrical conduction was observed for highly oriented SURMOF films and corroborated with Seebeck coefficient measurements. Van der Pauw four-point Hall sample measurements provide important insight into the electrical behavior of such porous and hybrid organic-inorganic crystalline materials, which renders them attractive for potential use in microelectronic and optoelectronic devices and thermoelectric applications.

摘要

这项关于金属有机框架(MOF)HUKUST-1薄膜的研究重点在于比较未掺杂的原始状态以及通过TCNQ渗透MOF孔结构进行掺杂的情况。我们已经确定了HKUST-1薄膜随温度变化的电荷传输和n型导电性。此外,还详细表征了其电导率和电流-电压特性。由于MOF最常见的形式,即块状MOF粉末,不容易进行电学表征研究,因此在本研究中,电学测量是在致密、紧凑的表面锚定金属有机框架(SURMOF)薄膜上进行的。这些整体式、定义明确且优先(001)取向的MOF薄膜是使用准液相外延(LPE)在经过特殊功能化的硅或硼硅酸盐玻璃基板上生长的。除了原始的SURMOF薄膜外,还研究了用TCNQ加载这些多孔薄膜的效果。对于高度取向的SURMOF薄膜,观察到了正电荷载流子传导和强电导率各向异性,并通过塞贝克系数测量得到了证实。范德堡四点霍尔样品测量为这种多孔和有机-无机混合晶体材料的电学行为提供了重要见解,这使其在微电子和光电器件以及热电应用中具有潜在应用吸引力。

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