Kashirtsev Filipp, Simon Jacob C, Fried Daniel
University of California, San Francisco, San Francisco, CA 94143-0758.
Proc SPIE Int Soc Opt Eng. 2021 Mar;11627. doi: 10.1117/12.2588696. Epub 2021 Mar 5.
Dental fluorosis is an increasing problem in the U.S. due to excessive exposure to fluoride from the environment. Fluorosis causes hypomineralization of the enamel during tooth development and mild fluorosis is visible as faint white lines on the tooth surface while the most severe fluorosis can result in pitted surfaces. It is difficult to quantify the severity of fluorosis and assessments are limited to subjective visual assessments. Dental fluorosis appears with very high contrast at short wavelength infrared (SWIR) wavelengths beyond 1400-nm and we hypothesize that these wavelengths may be better suited for detecting mild fluorosis and for estimating the severity. In this study the contrast of fluorosis of varying severity on extracted human permanent teeth was measured at SWIR wavelengths ranging from 1300-2000-nm using an extended range InGaAs camera and broadband light sources. Cross polarization optical coherence tomography was used to measure the depth of hypomineralization.
由于环境中氟化物暴露过量，在美国，牙齿氟中毒问题日益严重。氟中毒会在牙齿发育过程中导致牙釉质矿化不足，轻度氟中毒表现为牙齿表面的细微白线，而最严重的氟中毒会导致牙齿表面出现凹坑。氟中毒的严重程度难以量化，评估仅限于主观视觉评估。在波长超过1400纳米的短波长红外（SWIR）波段，牙齿氟中毒呈现出非常高的对比度，我们推测这些波长可能更适合检测轻度氟中毒并估计其严重程度。在本研究中，使用扩展范围的铟镓砷相机和宽带光源，在1300 - 2000纳米的SWIR波长范围内，测量了拔除的人类恒牙上不同严重程度氟中毒的对比度。采用交叉偏振光学相干断层扫描技术测量矿化不足的深度。
