纳米材料分析的光学和电子显微镜技术。

Optical and Electron Microscopy for Analysis of Nanomaterials.

机构信息

School of International Engineering and Science, Jeonbuk National University, Jeonju, Republic of Korea.

Department of Surgery, Cedars-Sinai Medical Center, Los Angeles, CA, USA.

出版信息

Adv Exp Med Biol. 2021;1309:277-287. doi: 10.1007/978-981-33-6158-4_12.

DOI:10.1007/978-981-33-6158-4_12

PMID:33782877

Abstract

Not only is fabrication important for research in materials science, but also materials characterization and analysis. Special microscopes capable of ultra-high magnification are more essential for observing and analyzing nanoparticles than for macro-size particles. Recently, electron microscopy (EM) and scanning probe microscopy (SPM) are commonly used for observing and analyzing nanoparticles. In this chapter, the basic principles of various techniques in optical and electron microscopy are described and classified. In particular, techniques such as transmission electron microscopy (TEM) and scanning electron microscopy (SEM) are explained.

摘要

不仅在材料科学研究中，而且在材料特性描述和分析中，捏造都是很重要的。与观察和分析大尺寸颗粒相比，特殊的超高倍显微镜对于观察和分析纳米颗粒更为必要。最近，电子显微镜（EM）和扫描探针显微镜（SPM）常用于观察和分析纳米颗粒。在本章中，对光学显微镜和电子显微镜中各种技术的基本原理进行了描述和分类。特别是，对透射电子显微镜（TEM）和扫描电子显微镜（SEM）等技术进行了说明。