Author Correction: Nanoscale-femtosecond dielectric response of Mott insulators captured by two-color near-field ultrafast electron microscopy.
作者信息
Fu Xuewen, Barantani Francesco, Gargiulo Simone, Madan Ivan, Berruto Gabriele, LaGrange Thomas, Jin Lei, Wu Junqiao, Vanacore Giovanni Maria, Carbone Fabrizio, Zhu Yimei
机构信息
School of Physics, Ultrafast Electron Microscopy Laboratory, Nankai University, Tianjin, 300071, China.
Condensed Matter Physics and Material Science Department, Brookhaven National Laboratory, Upton, NY, 11973, USA.
出版信息
Nat Commun. 2021 Apr 1;12(1):2123. doi: 10.1038/s41467-021-22477-6.
Abstract
摘要
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