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优化用于碳纳米管/纳米团簇杂化物精确微分析的扫描电子显微镜样品制备方法。

Optimizing the SEM specimen preparation method for accurate microanalysis of carbon nanotube/nanocluster hybrids.

作者信息

Yue Nailin, Wang Li, He Xingquan, Liu Hongyan, Zhang Wei

机构信息

State Key Laboratory of Automotive Simulation and Control, and School of Materials Science & Engineering, and Electron Microscopy Center, and International Center of Future Science, Jilin University, Changchun, China.

School of Chemistry and Environmental Engineering, Changchun University of Science and Technology, Changchun, China.

出版信息

J Microsc. 2021 Jun;282(3):267-273. doi: 10.1111/jmi.13008. Epub 2021 Apr 14.

DOI:10.1111/jmi.13008
PMID:33797758
Abstract

Scanning electron microscopy (SEM) integrated with energy-dispersive X-ray spectrometry (EDS) are scientifically used to characterise the morphology, chemical composition and elemental distribution of powder samples. Upon an accessible analytical instrument, the specimen preparation method directly affects the quality and accuracy of the observation and analysis. In this paper, three preparation methods were utilised to characterise the carbon nanotubes (CNTs) based materials, and their strengths as well as the limitations are discussed. Thus, a characterisation strategy was established by comparing the obtained three measurement together with the derived sample information. To the end, we proposed to acquire the backscattered electron (BSE) images of nanoscale heavier nanoclusters grafted CNTs, typically for wide functional applications such as energy conversion and storage. Our proposed optimum method works particularly on the clarification of powder samples with small particle sizes and low atomic numbers, which underscores the involved contribution of SEM backscattered electron images.

摘要

扫描电子显微镜(SEM)与能量色散X射线光谱仪(EDS)相结合,被科学地用于表征粉末样品的形态、化学成分和元素分布。在可使用的分析仪器上,样品制备方法直接影响观察和分析的质量与准确性。本文采用三种制备方法对碳纳米管(CNT)基材料进行表征,并讨论了它们的优点和局限性。因此,通过将获得的三种测量结果与衍生的样品信息进行比较,建立了一种表征策略。最后,我们建议获取接枝了纳米级较重纳米团簇的碳纳米管的背散射电子(BSE)图像,特别是用于能量转换和存储等广泛的功能应用。我们提出的最佳方法特别适用于澄清小粒径和低原子序数的粉末样品,这突出了扫描电子显微镜背散射电子图像的相关贡献。

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