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基于不同标记平台的全基因组关联研究与欧洲冬小麦叶枯病(Tan Spot ( ))感染的预测。

Genome-Wide Association Studies and Prediction of Tan Spot () Infection in European Winter Wheat via Different Marker Platforms.

机构信息

Leibniz Institute of Plant Genetics and Crop Plant Research (IPK), Corrensstraße 3, D-06466 Stadt Seeland OT Gatersleben, Germany.

European Wheat Breeding Center, BASF Agricultural Solutions GmbH, Am Schwabeplan 8, D-06466 Stadt Seeland OT Gatersleben, Germany.

出版信息

Genes (Basel). 2021 Mar 27;12(4):490. doi: 10.3390/genes12040490.

DOI:10.3390/genes12040490
PMID:33801723
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8103242/
Abstract

Tan spot, caused by the fungus (), is a severe foliar disease of wheat ( L.). Improving genetic resistance is a durable strategy to reduce -related losses. Here, we dissected -infection's genetic basis in 372 European wheat varieties via single sequence repeats (SSR) in addition to 35k and 90k single nucleotide polymorphism (SNP) marker platforms. In our phenotypic data analyses, infection showed a significant genotypic variance and a significant negative correlation with plant height. Genome-wide association studies revealed a highly quantitative nature of infection and identified two quantitative trait loci (QTL), viz., and , which imparted 21.23 and 5.84% of the genotypic variance, respectively. Besides, the gene showed a strong allelic influence on the resistance scores. Due to the complex genetic nature of the infection, the potential of genome-wide prediction (GP) was assessed via three different genetic models on individual and combined marker platforms. The GP results indicated that the marker density and marker platforms do not considerably impact prediction accuracy (~40-42%) and that higher-order epistatic interactions may not be highly pervasive. Our results provide a further understanding of -infection's genetic nature, serve as a resource for marker-assisted breeding, and highlight the potential of genome-wide selection for improved resistance.

摘要

叶枯病由真菌 () 引起,是小麦 (L.) 的一种严重叶片病害。提高遗传抗性是减少与病害相关损失的一种持久策略。在这里,我们通过单核苷酸多态性 (SNP) 标记平台的 35k 和 90k 以及单序列重复 (SSR),在 372 个欧洲小麦品种中对 -感染的遗传基础进行了剖析。在我们的表型数据分析中,-感染表现出显著的基因型方差,与株高呈显著负相关。全基因组关联研究揭示了 -感染的高度数量性质,并鉴定出两个数量性状位点 (QTL),即 和 ,分别赋予基因型方差的 21.23%和 5.84%。此外,基因表现出对抗性评分的强烈等位基因影响。由于 -感染的遗传性质复杂,通过三种不同的遗传模型对个体和组合标记平台进行了全基因组预测 (GP) 的潜力评估。GP 结果表明,标记密度和标记平台对预测准确性的影响不大(约 40-42%),并且高阶上位性相互作用可能不是高度普遍的。我们的研究结果进一步了解了 -感染的遗传性质,为标记辅助育种提供了资源,并强调了全基因组选择在提高抗性方面的潜力。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/0333a1e4919e/genes-12-00490-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/4ddf23183383/genes-12-00490-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/d1932b3094c0/genes-12-00490-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/49efb24cf7cd/genes-12-00490-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/0333a1e4919e/genes-12-00490-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/4ddf23183383/genes-12-00490-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/d1932b3094c0/genes-12-00490-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/49efb24cf7cd/genes-12-00490-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/05a0/8103242/0333a1e4919e/genes-12-00490-g004.jpg

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Genome-wide association mapping of tan spot resistance in a worldwide collection of durum wheat.
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Front Plant Sci. 2023 May 10;14:1132699. doi: 10.3389/fpls.2023.1132699. eCollection 2023.
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