小麦抗四种叶斑病的遗传与育种
Genetics and breeding for resistance against four leaf spot diseases in wheat ( L.).
作者信息
Gupta Pushpendra Kumar, Vasistha Neeraj Kumar, Singh Sahadev, Joshi Arun Kumar
机构信息
Department of Genetics and Plant Breeding, Chaudhary Charan Singh University, Meerut, India.
Murdoch's Centre for Crop and Food Innovation, Murdoch University, Murdoch, WA, Australia.
出版信息
Front Plant Sci. 2023 Mar 29;14:1023824. doi: 10.3389/fpls.2023.1023824. eCollection 2023.
In wheat, major yield losses are caused by a variety of diseases including rusts, spike diseases, leaf spot and root diseases. The genetics of resistance against all these diseases have been studied in great detail and utilized for breeding resistant cultivars. The resistance against leaf spot diseases caused by each individual necrotroph/hemi-biotroph involves a complex system involving resistance (R) genes, sensitivity (S) genes, small secreted protein (SSP) genes and quantitative resistance loci (QRLs). This review deals with resistance for the following four-leaf spot diseases: (i) Septoria nodorum blotch (SNB) caused by ; (ii) Tan spot (TS) caused by -; (iii) Spot blotch (SB) caused by and (iv) Septoria tritici blotch (STB) caused by .
在小麦中，主要的产量损失是由多种病害引起的，包括锈病、穗部病害、叶斑病和根病。针对所有这些病害的抗性遗传学已得到深入研究，并被用于培育抗病品种。对由每种单独的坏死营养型/半活体营养型引起的叶斑病的抗性涉及一个复杂的系统，该系统包括抗性（R）基因、敏感性（S）基因、小分泌蛋白（SSP）基因和数量抗性位点（QRL）。本综述涉及以下四种叶斑病的抗性：（i）由引起的小麦颖枯病（SNB）；（ii）由引起的黄斑病（TS）；（iii）由引起的条斑病（SB）；以及（iv）由引起的小麦叶枯病（STB）。 （注：原文中部分病原菌名称未完整给出）
Zotero 插件