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角扩展对任意形状电子束强度分布的影响。

The effect of angular spread on the intensity distribution of arbitrarily shaped electron beams.

作者信息

Mohan R, Chui C S, Fontenla D, Han K, Ballon D

机构信息

Department of Medical Physics, Memorial Sloan-Kettering Cancer Center, New York, New York 10021.

出版信息

Med Phys. 1988 Mar-Apr;15(2):204-10. doi: 10.1118/1.596252.

Abstract

Knowledge of the relative intensity distribution at the patient's surface is essential for pencil beam calculations of three-dimensional dose distributions for arbitrarily shaped electron beams. To calculate the relative intensity distribution, the spatial spread resulting from angular spread is convolved with a two-dimensional step function whose shape corresponds to the applicator aperture. Two different approaches to obtain angular spread or the equivalent spatial spread are investigated. In the first method, the pencil beam angular spread is assumed to be Gaussian in shape. The angular spread constants (sigma theta) are then obtained from the slopes of measured intensity profiles. In the second method, the angular spread, in the form of an array of numerical values, is obtained by the deconvolution of measured intensity profiles. After obtaining the angular spread, the calculation for convolution is done in a number of parallel planes normal to the central axis at various distances from the electron collimator. Intensity at any arbitrary point in space is computed by interpolating between intensity distributions in adjacent planes on either side of the point. The effects of variations in angular spread as a function of field size for two treatment machines, one with a scanned electron beam and the other with a scattering foil, have been studied. The consequences of assuming angular spread to be of Gaussian shape are also examined. The electron intensity calculation techniques described in this paper apply primarily to methods of dose calculations that employ pencil beams generated using Monte Carlo simulations.

摘要

了解患者体表的相对强度分布对于任意形状电子束三维剂量分布的笔形束计算至关重要。为了计算相对强度分布,将由角展宽引起的空间展宽与形状对应于施源器孔径的二维阶跃函数进行卷积。研究了两种获取角展宽或等效空间展宽的不同方法。在第一种方法中,假定笔形束角展宽呈高斯形状。然后从测量强度分布的斜率获得角展宽常数(σθ)。在第二种方法中,通过对测量强度分布进行反卷积,以数值数组的形式获得角展宽。获得角展宽后,在与电子准直器不同距离处垂直于中心轴的多个平行平面中进行卷积计算。通过在该点两侧相邻平面的强度分布之间进行插值来计算空间中任意点的强度。研究了两台治疗机(一台使用扫描电子束,另一台使用散射箔)的角展宽随射野大小变化的影响。还研究了假定角展宽呈高斯形状的后果。本文所述的电子强度计算技术主要适用于采用蒙特卡罗模拟生成的笔形束的剂量计算方法。

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