Boone J M
Department of Radiology, University of Missouri, Columbia 65212.
Med Phys. 1988 May-Jun;15(3):304-10. doi: 10.1118/1.596223.
A parametric spectral model based on the work of Birch and Marshall is used to characterize the x-ray spectra of a specific x-ray system. Using least-squares comparison between measured and calculated attenuation data, an equivalent spectrum (EQSPEC) is iteratively found which very closely matches the measured attenuation characteristics of the x-ray system. The resulting parametric spectrum is a function of the anode angle (theta), equivalent kilovoltage (kVeq), and the equivalent aluminum filtration (Aleq), and these three parameters can serve as very concise yet very accurate indices of beam quality. The utility of the EQSPEC for characterization and reporting of x-ray spectra (and thus beam quality) may have numerous applications in diagnostic imaging procedures where spectral quality is an important consideration.
基于Birch和Marshall的工作所建立的参数光谱模型,用于表征特定X射线系统的X射线光谱。通过对测量和计算的衰减数据进行最小二乘法比较,迭代地找到一个等效光谱(EQSPEC),它与X射线系统的测量衰减特性非常匹配。所得的参数光谱是阳极角(θ)、等效千伏(kVeq)和等效铝过滤(Aleq)的函数,这三个参数可作为光束质量非常简洁而准确的指标。EQSPEC在表征和报告X射线光谱(以及光束质量)方面的实用性,在光谱质量是重要考虑因素的诊断成像程序中可能有许多应用。