Grauby Stéphane, Ben Amor Aymen, Hallais Géraldine, Vincent Laetitia, Dilhaire Stefan
CNRS, Laboratoire Ondes et Matière d'Aquitaine LOMA, Université de Bordeaux, UMR 5798, 33400 Talence, France.
CNRS, Centre de Nanosciences et de Nanotechnologies-C2N, Université Paris Saclay, 91120 Palaiseau, France.
Nanomaterials (Basel). 2021 May 1;11(5):1199. doi: 10.3390/nano11051199.
Based on our previous experimental AFM set-up specially designed for thermal conductivity measurements at the nanoscale, we have developed and validated a prototype which offers two major advantages. On the one hand, we can simultaneously detect various voltages, providing, at the same time, both thermal and electrical properties (thermal conductivity, electrical conductivity and Seebeck coefficient). On the other hand, the AFM approach enables sufficient spatial resolution to produce images of nanostructures such as nanowires (NWs). After a software and hardware validation, we show the consistency of the signals measured on a gold layer on a silicon substrate. Finally, we demonstrate that the imaging of Ge NWs can be achieved with the possibility to extract physical properties such as electrical conductivity and Seebeck coefficient, paving the way to a quantitative estimation of the figure of merit of nanostructures.
基于我们之前专门为纳米尺度热导率测量设计的实验性原子力显微镜（AFM）装置，我们开发并验证了一个具有两大优势的原型。一方面，我们能够同时检测各种电压，同时提供热学和电学性质（热导率、电导率和塞贝克系数）。另一方面，AFM方法能够实现足够的空间分辨率，以生成纳米线（NWs）等纳米结构的图像。经过软件和硬件验证后，我们展示了在硅衬底上的金层上测量信号的一致性。最后，我们证明可以实现锗纳米线的成像，并有可能提取诸如电导率和塞贝克系数等物理性质，为纳米结构品质因数的定量评估铺平了道路。
