Lee Ping-Chung, Wei Pai-Chun, Chen Yang-Yuan
Research Center for Electronics and Telecommunications (P2ET), Indonesian Institute of Sciences (LIPI), Bandung 40135, Indonesia.
Institute of Physics, Academia Sinica, Taipei 11529, Taiwan.
Nanomaterials (Basel). 2021 Mar 23;11(3):819. doi: 10.3390/nano11030819.
The discovery of topological insulators (TIs) has motivated detailed studies on their physical properties, especially on their novel surface states via strong spin-orbit interactions. However, surface-state-related thermoelectric properties are rarely reported, likely because of the involvement of their bulk-dominating contribution. In this work, we report thermoelectric studies on a TI bismuth selenide (BiSe) nanowire (NW) that exhibit a larger surface/volume ratio. Uniform single-crystalline TI BiSe NWs were successfully synthesized using a stress-induced growth method. To achieve the study of the thermoelectric properties of a nanowire (NW), including electrical conductivity (σ), Seebeck coefficient (S), and thermal conductivity (κ), a special platform for simultaneously performing all measurements on a single wire was designed. The properties of σ, S, and κ of a 200 nm NW that was well precharacterized using transmission electron microscope (TEM) measurements were determined using the four-probe method, the two-probe EMF across ∇T measurement, and the 3ω technique, respectively. The integrated TE properties represented by the figure of merit ZT (SσT/κ) were found to be in good agreement with a theoretical study of BiSe NW.
拓扑绝缘体(TIs)的发现激发了对其物理性质的详细研究,特别是通过强自旋轨道相互作用对其新奇表面态的研究。然而,与表面态相关的热电性质鲜有报道,这可能是因为其体主导贡献的影响。在这项工作中,我们报道了对具有较大表面/体积比的拓扑绝缘体硒化铋(BiSe)纳米线(NW)的热电研究。使用应力诱导生长法成功合成了均匀的单晶拓扑绝缘体BiSe纳米线。为了实现对纳米线(NW)热电性质的研究,包括电导率(σ)、塞贝克系数(S)和热导率(κ),设计了一个用于在单根纳米线上同时进行所有测量的特殊平台。使用四探针法、跨∇T的两探针电动势测量法和3ω技术分别测定了一根经透射电子显微镜(TEM)测量充分表征的200 nm纳米线的σ、S和κ性质。发现由品质因数ZT(SσT/κ)表示的综合热电性质与BiSe纳米线的理论研究结果高度一致。