X射线计算机断层扫描采集参数对增材制造缺陷图像质量及检测概率的影响
The Influence of X-Ray Computed Tomography Acquisition Parameters on Image Quality and Probability of Detection of Additive Manufacturing Defects.
作者信息
Kim Felix H, Pintar Adam L, Moylan Shawn P, Garboczi Edward J
机构信息
National Institute of Standards and Technology, Gaithersburg, MD 20899.
National Institute of Standards and Technology, Boulder, CO 80305.
出版信息
J Manuf Sci Eng. 2019 Nov;141(11). doi: 10.1115/1.4044515.
X-ray computed tomography (XCT) is a promising nondestructive evaluation technique for additive manufacturing (AM) parts with complex shapes. Industrial XCT scanning is a relatively new development, and XCT has several acquisition parameters that a user can change for a scan whose effects are not fully understood. An artifact incorporating simulated defects of different sizes was produced using laser powder bed fusion (LPBF) AM. The influence of six XCT acquisition parameters was investigated experimentally based on a fractional factorial designed experiment. Twenty experimental runs were performed. The noise level of the XCT images was affected by the acquisition parameters, and the importance of the acquisition parameters was ranked. The measurement results were further analyzed to understand the probability of detection (POD) of the simulated defects. The POD determination process is detailed, including estimation of the POD confidence limit curve using a bootstrap method. The results are interpreted in the context of the AM process and XCT acquisition parameters.
X射线计算机断层扫描（XCT）是一种很有前景的用于复杂形状增材制造（AM）零件的无损评估技术。工业XCT扫描是一项相对较新的发展，XCT有几个采集参数，用户可以针对扫描改变这些参数，但其效果尚未完全了解。使用激光粉末床熔融（LPBF）增材制造工艺制作了一个包含不同尺寸模拟缺陷的工件。基于分数析因设计实验，对六个XCT采集参数的影响进行了实验研究。进行了二十次实验运行。XCT图像的噪声水平受采集参数影响，并对采集参数的重要性进行了排序。对测量结果进行了进一步分析，以了解模拟缺陷的检测概率（POD）。详细介绍了POD确定过程，包括使用自助法估计POD置信限曲线。结合增材制造工艺和XCT采集参数对结果进行了解释。
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