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基于半导体微线的高性能光电探测器的激光数字制造

Laser digital manufacturing of high-performance photodetectors based on a semiconductor microwire.

作者信息

Liang Shuyu, Wang Shenyuan, Hua Jianguan, Li Shunxin, Xia Hong

出版信息

Opt Lett. 2021 Jul 15;46(14):3472-3475. doi: 10.1364/OL.434263.

Abstract

Digital manufacturing technology meets the needs of today's technological development. However, the post-processing is essential for some digital fabrication methods, such as annealing and ultraviolet (UV) exposure. Femtosecond laser direct writing (FsLDW) has gained considerable attention, because it is a non-photolithographic, non-vacuum, and no heat fabrication method. The photodetectors based on a semiconductor microwire were fabricated via FsLDW. Finally, the responsivity of the fabricated photodetectors based on zinc oxide (ZnO), titanium dioxide (), and tin oxide () can reach 14.27, 1.3, and 81 A/W, respectively. The enhanced performance is attributed to the rough and porous surface of ZnO, , and microwires. The whole preparation process is realized by the programmed control femtosecond laser scanning path. This Letter demonstrates that the fabrication method has potential in the digital manufacturing of high-performance UV photodetectors.

摘要

数字制造技术满足了当今技术发展的需求。然而,后处理对于一些数字制造方法至关重要,例如退火和紫外线(UV)曝光。飞秒激光直写(FsLDW)受到了广泛关注,因为它是一种非光刻、非真空且无热的制造方法。基于半导体微线的光电探测器是通过飞秒激光直写制造的。最后,基于氧化锌(ZnO)、二氧化钛()和氧化锡()制造的光电探测器的响应度分别可达14.27、1.3和81 A/W。性能的提升归因于ZnO、和微线粗糙且多孔的表面。整个制备过程通过程序控制的飞秒激光扫描路径实现。本信函表明该制造方法在高性能紫外光电探测器的数字制造方面具有潜力。

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