Fang Chen, Li Junze, Zhou Boxuan, Li Dehui
School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China.
Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan 430074, China.
Nano Lett. 2021 Jul 28;21(14):6156-6162. doi: 10.1021/acs.nanolett.1c01729. Epub 2021 Jul 19.
The detection of polarization states of light is essential in photonic and optoelectronic devices. Currently, the polarimeters are usually constructed with the help of waveplates or a comprehensive metasurface, which will inevitably increase the fabrication complexity and unnecessary energy loss. Here, we have successfully demonstrated a self-powered filterless on-chip full-Stokes polarimeter based on a single-layer MoS/few-layer MoS homojunction. Combining the built-in electric field enhanced circular photogalvanic effect with the intrinsic optical anisotropy of MoS between in-plane and out-of-plane directions, the device is able to conveniently sense four Stokes parameters of incident light at zero bias without requiring an extra filtering layer and can function in the wavelength range of 650-690 nm with acceptable average errors. Besides, this homojunction device is easy to integrate with silicon-based chips and could have much smaller sizes than metasurface based polarimeters. Our study thus provides an excellent paradigm for high-performance on-chip filterless polarimeters.
光偏振态的检测在光子和光电器件中至关重要。目前，偏振计通常借助波片或综合超表面构建，这将不可避免地增加制造复杂性和不必要的能量损耗。在此，我们成功展示了一种基于单层MoS/少层MoS同质结的自供电无滤波器片上全斯托克斯偏振计。该器件将内置电场增强的圆光电流效应与MoS面内和面外方向之间的固有光学各向异性相结合，能够在零偏置下方便地检测入射光的四个斯托克斯参数，无需额外的滤波层，并且能够在650 - 690 nm波长范围内工作，平均误差可接受。此外，这种同质结器件易于与硅基芯片集成，并且尺寸可能比基于超表面的偏振计小得多。因此，我们的研究为高性能片上无滤波器偏振计提供了一个出色的范例。
