Li Lingfei, Wang Junzhuan, Kang Lei, Liu Wei, Yu Li, Zheng Binjie, Brongersma Mark L, Werner Douglas H, Lan Shoufeng, Shi Yi, Xu Yang, Wang Xiaomu
School of Micro-Nanoelectronics, ZJU-Hangzhou Global Scientific and Technological Innovation Center, ZJU-UIUC Institute, State Key Labs of Silicon Materials and Modern Optical Instrumentation, Zhejiang University, Hangzhou 311200, China.
School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China.
ACS Nano. 2020 Dec 22;14(12):16634-16642. doi: 10.1021/acsnano.0c00724. Epub 2020 Nov 16.
The ability to detect the full-Stokes polarization of light is vital for a variety of applications that often require complex and bulky optical systems. Here, we report an on-chip polarimeter comprising four metasurface-integrated graphene-silicon photodetectors. The geometric chirality and anisotropy of the metasurfaces result in circular and linear polarization-resolved photoresponses, from which the full-Stokes parameters, including the intensity, orientation, and ellipticity of arbitrarily polarized incident infrared light (1550 nm), can be obtained. The design presents an ultracompact architecture while excluding the standard bulky optical components and structural redundancy. Computational extraction of full-Stokes parameters from mutual information among four detectors eliminates the need for a large absorption contrast between different polarization states. Our monolithic plasmonic metasurface integrated polarimeter is ideal for a variety of polarization-based applications including biological sensing, quantum information processing, and polarization photography.
检测光的全斯托克斯偏振的能力对于各种通常需要复杂且庞大光学系统的应用至关重要。在此，我们报告一种片上偏振计，它由四个集成了超表面的石墨烯 - 硅光电探测器组成。超表面的几何手性和各向异性导致了圆偏振和线性偏振分辨的光响应，从中可以获得包括任意偏振入射红外光（1550纳米）的强度、方向和椭圆率在内的全斯托克斯参数。该设计呈现出超紧凑的架构，同时摒弃了标准的庞大光学组件和结构冗余。通过从四个探测器之间的互信息中进行全斯托克斯参数的计算提取，消除了不同偏振态之间需要大吸收对比度的需求。我们的单片等离子体超表面集成偏振计非常适合包括生物传感、量子信息处理和偏振摄影在内的各种基于偏振的应用。
