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利用高分辨率布里渊光谱研究半导体/拓扑绝缘体Si/BiTe异质结构中的表面声子色散

Dispersion of the surface phonons in semiconductor/topological insulator Si/BiTe heterostructure studied by high resolution Brillouin spectroscopy.

作者信息

Trzaskowska A, Mielcarek S, Wiesner M, Lombardi F, Mroz B

机构信息

Faculty of Physics, Adam Mickiewicz University, Uniwersytetu Poznańskiego 2, 61-614 Poznan, Poland.

Faculty of Physics, Adam Mickiewicz University, Uniwersytetu Poznańskiego 2, 61-614 Poznan, Poland.

出版信息

Ultrasonics. 2021 Dec;117:106526. doi: 10.1016/j.ultras.2021.106526. Epub 2021 Jul 21.

Abstract

The dynamics and dispersion of surface phonons in heterostructure semiconductor/ topological insulator Si/BiTe was investigated using high resolution Brillouin light scattering method in the GHz frequency range. Both Rayleigh and Sezawa surface acoustic waves have been observed for wave vectors ranging from 0.006 to 0.023 nm. Anomaly in dispersion relations ω(q) for both surface waves were detected for the wave vector q = 0.016 nm. The finite element method (FEM) was used to simulate the observed shapes of ω(q) and to find the deformation profiles of surface acoustic waves. We attribute the observed changes to the coupling between low energy electrons and surface phonons. The coupling between helical Dirac states and surface phonons is discussed in the frame of accessible theoretical models.

摘要

利用GHz频率范围内的高分辨率布里渊光散射方法,研究了异质结构半导体/拓扑绝缘体Si/BiTe中表面声子的动力学和色散。对于波矢范围从0.006到0.023 nm的情况,均观测到了瑞利表面声波和泽瓦表面声波。对于波矢q = 0.016 nm,检测到了两种表面波的色散关系ω(q)出现异常。采用有限元方法(FEM)模拟观测到的ω(q)形状,并找出表面声波的形变轮廓。我们将观测到的变化归因于低能电子与表面声子之间的耦合。在可及的理论模型框架内,讨论了螺旋狄拉克态与表面声子之间的耦合。

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