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β相GaO和(AlGa)O异质外延薄膜的热导率

Thermal Conductivity of β-Phase GaO and (AlGa)O Heteroepitaxial Thin Films.

作者信息

Song Yiwen, Ranga Praneeth, Zhang Yingying, Feng Zixuan, Huang Hsien-Lien, Santia Marco D, Badescu Stefan C, Gonzalez-Valle C Ulises, Perez Carlos, Ferri Kevin, Lavelle Robert M, Snyder David W, Klein Brianna A, Deitz Julia, Baca Albert G, Maria Jon-Paul, Ramos-Alvarado Bladimir, Hwang Jinwoo, Zhao Hongping, Wang Xiaojia, Krishnamoorthy Sriram, Foley Brian M, Choi Sukwon

机构信息

Department of Mechanical Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.

Department of Electrical and Computer Engineering, University of Utah, Salt Lake City, Utah 84112, United States.

出版信息

ACS Appl Mater Interfaces. 2021 Aug 18;13(32):38477-38490. doi: 10.1021/acsami.1c08506. Epub 2021 Aug 9.

DOI:10.1021/acsami.1c08506
PMID:34370459
Abstract

Heteroepitaxy of β-phase gallium oxide (β-GaO) thin films on foreign substrates shows promise for the development of next-generation deep ultraviolet solar blind photodetectors and power electronic devices. In this work, the influences of the film thickness and crystallinity on the thermal conductivity of (2̅01)-oriented β-GaO heteroepitaxial thin films were investigated. Unintentionally doped β-GaO thin films were grown on -plane sapphire substrates with off-axis angles of 0° and 6° toward ⟨112̅0⟩ via metal-organic vapor phase epitaxy (MOVPE) and low-pressure chemical vapor deposition. The surface morphology and crystal quality of the β-GaO thin films were characterized using scanning electron microscopy, X-ray diffraction, and Raman spectroscopy. The thermal conductivities of the β-GaO films were measured via time-domain thermoreflectance. The interface quality was studied using scanning transmission electron microscopy. The measured thermal conductivities of the submicron-thick β-GaO thin films were relatively low as compared to the intrinsic bulk value. The measured thin film thermal conductivities were compared with the Debye-Callaway model incorporating phononic parameters derived from first-principles calculations. The comparison suggests that the reduction in the thin film thermal conductivity can be partially attributed to the enhanced phonon-boundary scattering when the film thickness decreases. They were found to be a strong function of not only the layer thickness but also the film quality, resulting from growth on substrates with different offcut angles. Growth of β-GaO films on 6° offcut sapphire substrates was found to result in higher crystallinity and thermal conductivity than films grown on on-axis -plane sapphire. However, the β-GaO films grown on 6° offcut sapphire exhibit a lower thermal boundary conductance at the β-GaO/sapphire heterointerface. In addition, the thermal conductivity of MOVPE-grown (2̅01)-oriented β-(AlGa)O thin films with Al compositions ranging from 2% to 43% was characterized. Because of phonon-alloy disorder scattering, the β-(AlGa)O films exhibit lower thermal conductivities (2.8-4.7 W/m·K) than the β-GaO thin films. The dominance of the alloy disorder scattering in β-(AlGa)O is further evidenced by the weak temperature dependence of the thermal conductivity. This work provides fundamental insight into the physical interactions that govern phonon transport within heteroepitaxially grown β-phase GaO and (AlGa)O thin films and lays the groundwork for the thermal modeling and design of β-GaO electronic and optoelectronic devices.

摘要

在异质衬底上生长的β相氧化镓(β-GaO)薄膜的异质外延,对于下一代深紫外日盲光电探测器和功率电子器件的发展具有重要意义。在这项工作中,研究了薄膜厚度和结晶度对(2̅01)取向的β-GaO异质外延薄膜热导率的影响。通过金属有机气相外延(MOVPE)和低压化学气相沉积,在向⟨112̅0⟩方向具有0°和6°离轴角的c面蓝宝石衬底上生长了非故意掺杂的β-GaO薄膜。使用扫描电子显微镜、X射线衍射和拉曼光谱对β-GaO薄膜的表面形貌和晶体质量进行了表征。通过时域热反射法测量了β-GaO薄膜的热导率。使用扫描透射电子显微镜研究了界面质量。与本征体材料值相比,亚微米厚的β-GaO薄膜的实测热导率相对较低。将测得的薄膜热导率与结合了从第一性原理计算得出的声子参数的德拜-卡拉韦模型进行了比较。比较结果表明,当薄膜厚度减小时,薄膜热导率的降低可部分归因于声子-边界散射的增强。结果发现,它们不仅是层厚的强函数,也是薄膜质量的强函数,这是由于在具有不同离轴角的衬底上生长所致。发现在6°离轴蓝宝石衬底上生长的β-GaO薄膜比在轴向c面蓝宝石上生长的薄膜具有更高的结晶度和热导率。然而,在6°离轴蓝宝石上生长的β-GaO薄膜在β-GaO/蓝宝石异质界面处表现出较低的热边界电导。此外,还对Al成分范围为2%至43%的MOVPE生长的(2̅01)取向的β-(AlGa)O薄膜的热导率进行了表征。由于声子合金无序散射,β-(AlGa)O薄膜的热导率(2.8-4.7 W/m·K)低于β-GaO薄膜。热导率对温度的弱依赖性进一步证明了合金无序散射在β-(AlGa)O中的主导地位。这项工作为理解异质外延生长的β相GaO和(AlGa)O薄膜中声子输运的物理相互作用提供了基本见解,并为β-GaO电子和光电器件的热建模和设计奠定了基础。

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引用本文的文献

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Effect of extended defects on photoluminescence of gallium oxide and aluminum gallium oxide epitaxial films.
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