Ziaee Bideskan Mehri, Forooraghi Keyvan, Atlasbaf Zahra, Mehrdadian Ali, Lavrinenko Andrei V
Opt Express. 2021 Aug 30;29(18):28787-28804. doi: 10.1364/OE.433185.
Due to the increasing interest in emerging applications of graphene or other 2D material-based devices in photonics, a powerful, fast and accurate tool for the analysis of such structures is really in need. In this paper, the semi-analytical method of lines (MoL) is generalized for the diffraction analysis of tunable graphene-based plasmonic devices possessing three dimensional periodicity. We employ Floquet's theorem to handle analytically propagation of waves in the periodicity of the graphene-dielectric arrays in the direction of the layers stacking. This makes the method very effective in terms of computational time and memory consumption. To validate its efficiency and accuracy, the method is applied to plasmonic devices formed by alternating patterned graphene sheets and dielectric layers. Direct comparison with results available in literature and those obtained by a commercial software exhibits their full consistency.
由于对石墨烯或其他基于二维材料的器件在光子学中的新兴应用的兴趣日益浓厚，因此迫切需要一种强大、快速且准确的工具来分析此类结构。本文将线方法（MoL）这一半解析方法推广用于具有三维周期性的可调谐石墨烯基等离子体器件的衍射分析。我们采用弗洛凯定理来解析处理波在石墨烯 - 电介质阵列沿层堆叠方向的周期性中的传播。这使得该方法在计算时间和内存消耗方面非常有效。为了验证其效率和准确性，该方法被应用于由交替排列的图案化石墨烯片和电介质层形成的等离子体器件。与文献中可得的结果以及通过商业软件获得的结果进行直接比较，显示出它们完全一致。
