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自闭症相关基因突变导致 K7 通道门控电流。

Autism-associated mutations in K7 channels induce gating pore current.

机构信息

Department of Pharmacology, University of Washington, Seattle, WA 98195;

Department of Pharmacology, University of Washington, Seattle, WA 98195.

出版信息

Proc Natl Acad Sci U S A. 2021 Nov 9;118(45). doi: 10.1073/pnas.2112666118.

Abstract

Autism spectrum disorder (ASD) adversely impacts >1% of children in the United States, causing social interaction deficits, repetitive behaviors, and communication disorders. Genetic analysis of ASD has advanced dramatically through genome sequencing, which has identified >500 genes with mutations in ASD. Mutations that alter arginine gating charges in the voltage sensor of the voltage-gated potassium (K) channel K7 (KCNQ) are among those frequently associated with ASD. We hypothesized that these gating charge mutations would induce gating pore current (also termed ω-current) by causing an ionic leak through the mutant voltage sensor. Unexpectedly, we found that wild-type K7 conducts outward gating pore current through its native voltage sensor at positive membrane potentials, owing to a glutamine in the third gating charge position. In bacterial and human K7 channels, gating charge mutations at the R1 and R2 positions cause inward gating pore current through the resting voltage sensor at negative membrane potentials, whereas mutation at R4 causes outward gating pore current through the activated voltage sensor at positive potentials. Remarkably, expression of the K7.3/R2C ASD-associated mutation in vivo in midbrain dopamine neurons of mice disrupts action potential generation and repetitive firing. Overall, our results reveal native and mutant gating pore current in K7 channels and implicate altered control of action potential generation by gating pore current through mutant K7 channels as a potential pathogenic mechanism in autism.

摘要

自闭症谱系障碍(ASD)影响美国超过 1%的儿童,导致社交互动缺陷、重复行为和沟通障碍。通过基因组测序,对 ASD 的遗传分析取得了显著进展,鉴定出 ASD 中存在 500 多个突变基因。改变电压门控钾(K)通道 K7(KCNQ)电压传感器中精氨酸门控电荷的突变就是其中与 ASD 频繁相关的突变之一。我们假设这些门控电荷突变会通过突变电压传感器引起离子渗漏,从而诱导门控孔电流(也称为 ω-电流)。出乎意料的是,我们发现野生型 K7 在正膜电位下通过其天然电压传感器传导外向门控孔电流,这是由于第三个门控电荷位置的谷氨酰胺所致。在细菌和人类 K7 通道中,R1 和 R2 位置的门控电荷突变会在负膜电位下通过静止电压传感器引起内向门控孔电流,而 R4 位置的突变会在正电位下通过激活的电压传感器引起外向门控孔电流。值得注意的是,在小鼠中脑多巴胺神经元中体内表达 K7.3/R2C 与 ASD 相关的突变会破坏动作电位的产生和重复发放。总的来说,我们的结果揭示了 K7 通道中的天然和突变门控孔电流,并表明突变 K7 通道通过门控孔电流对动作电位产生的控制改变可能是自闭症的潜在致病机制。

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