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解析异质结构纳米线中窄带隙p-n纳米结的电子能带结构

Unraveling electronic band structure of narrow-bandgap p-n nanojunctions in heterostructured nanowires.

作者信息

Zamani Reza R, Hage Fredrik S, Eljarrat Alberto, Namazi Luna, Ramasse Quentin M, Dick Kimberly A

机构信息

Solid State Physics, Lund University, Box 118, Lund 22100, Sweden.

Department of Physics, Chalmers University of Technology, Gothenburg 41296, Sweden.

出版信息

Phys Chem Chem Phys. 2021 Nov 17;23(44):25019-25023. doi: 10.1039/d1cp03275e.

Abstract

The electronic band structure of complex nanostructured semiconductors has a considerable effect on the final electronic and optical properties of the material and, ultimately, on the functionality of the devices incorporating them. Valence electron energy-loss spectroscopy (VEELS) in the transmission electron microscope (TEM) provides the possibility of measuring this property of semiconductors with high spatial resolution. However, it still represents a challenge for narrow-bandgap semiconductors, since an electron beam with low energy spread is required. Here we demonstrate that by means of monochromated VEELS we can study the electronic band structure of narrow-gap materials GaSb and InAs in the form of heterostructured nanowires, with bandgap values down to 0.5 eV, especially important for newly developed structures with unknown bandgaps. Using complex heterostructured InAs-GaSb nanowires, we determine a bandgap value of 0.54 eV for wurtzite InAs. Moreover, we directly compare the bandgaps of wurtzite and zinc blende polytypes of GaSb in a single nanostructure, measured here as 0.84 and 0.75 eV, respectively. This allows us to solve an existing controversy in the band alignment between these structures arising from theoretical predictions. The findings demonstrate the potential of monochromated VEELS to provide a better understanding of the band alignment at the heterointerfaces of narrow-bandgap complex nanostructured materials with high spatial resolution. This is especially important for semiconductor device applications where even the slightest variations of the electronic band structure at the nanoscale can play a crucial role in their functionality.

摘要

复杂纳米结构半导体的电子能带结构对材料的最终电子和光学性质有相当大的影响,并最终影响包含它们的器件的功能。透射电子显微镜(TEM)中的价电子能量损失谱(VEELS)提供了以高空间分辨率测量半导体这一性质的可能性。然而,对于窄带隙半导体来说,这仍然是一个挑战,因为需要低能量分散的电子束。在这里,我们证明通过单色化的VEELS,我们可以研究异质结构纳米线形式的窄带隙材料GaSb和InAs的电子能带结构,其带隙值低至0.5 eV,这对于具有未知带隙的新开发结构尤为重要。使用复杂的异质结构InAs-GaSb纳米线,我们确定纤锌矿InAs的带隙值为0.54 eV。此外,我们在单个纳米结构中直接比较了GaSb的纤锌矿和闪锌矿多型体的带隙,此处测量值分别为0.84和0.75 eV。这使我们能够解决理论预测中这些结构之间能带排列存在的争议。这些发现证明了单色化VEELS在以高空间分辨率更好地理解窄带隙复杂纳米结构材料异质界面处的能带排列方面的潜力。这对于半导体器件应用尤为重要,因为即使在纳米尺度上电子能带结构的最微小变化也可能在其功能中起关键作用。

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