Black David R, Mendenhall Marcus H, Henins Albert, Filliben James, Cline James P
National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Powder Diffr. 2020 Sep;35(3). doi: 10.1017/s0885715620000366.
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of the instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM 640f, the seventh generation of this powder diffraction SRM, which is designed to be used primarily for calibrating powder diffractometers with respect to line position; it also can be used for the determination of the instrument profile function. It is certified with respect to the lattice parameter and consists of approximately 7.5 g of silicon powder prepared to minimize line broadening. A NIST-built diffractometer, incorporating many advanced design features, was used to certify the lattice parameter of the Si powder. Both statistical and systematic uncertainties have been assigned to yield a certified value for the lattice parameter at 22.5 °C of = 0.5431144 ± 0.000008 nm.
美国国家标准与技术研究院(NIST)认证了一套标准参考物质(SRM),用于评估X射线和中子粉末衍射仪仪器性能的特定方面。本报告描述了SRM 640f,这是该粉末衍射SRM的第七代产品,主要设计用于校准粉末衍射仪的谱线位置;它也可用于确定仪器的轮廓函数。它的晶格参数经过认证,由约7.5 g硅粉组成,制备时尽量减少谱线展宽。一台采用了许多先进设计特点的NIST制造的衍射仪用于认证硅粉的晶格参数。已给出统计不确定度和系统不确定度,以得出22.5 °C时晶格参数的认证值为 = 0.5431144 ± 0.000008 nm。