High-precision measurement of the X-ray Cu K spectrum.

The structure of the X-ray emission lines of the Cu K complex has been remeasured on a newly commissioned instrument, in a manner directly traceable to the Système Internationale definition of the meter. In this measurement, the region from 8000 eV to 8100 eV has been covered with a highly precise angular scale, and well-defined system efficiency, providing accurate wavelengths and relative intensities. This measurement updates the standard multi-Lorentzian-fit parameters from Härtwig, Hölzer, , and is in modest disagreement with their results for the wavelength of the K line when compared via quadratic fitting of the peak top; the intensity ratio of K to K agrees within the combined error bounds. However, the position of the fitted top of K is very sensitive to the fit parameters, so it is not believed to be a robust value to quote without further qualification. We also provide accurate intensity and wavelength information for the so-called K "satellite" complex. Supplementary data is provided which gives the entire shape of the spectrum in this region, allowing it to be used directly in cases where simplified, multi-Lorentzian fits to it are not sufficiently accurate.