Lyu Nanfang, Zuo Jian, Zhao Yuanmeng, Zhang Cunlin
Beijing Advanced Innovation Center for Imaging Technology, Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Beijing Key Laboratory for Terahertz Spectroscopy and Imaging, Department of Physics, Capital Normal University, Beijing 100048, China.
Sensors (Basel). 2021 Nov 9;21(22):7451. doi: 10.3390/s21227451.
Terahertz focal plane array imaging methods, direct camera imaging and conventional light field imaging methods are incapable of resolving and separating layers of multilayer objects. In this paper, for the purpose of fast, high-resolution and layer-resolving imaging of multilayer structures with different reflection characteristics, a novel angular intensity filtering (AIF) method based on terahertz light-field imaging is purposed. The method utilizes the extra dimensional information from the 4D light field and the reflection characteristics of the imaging object, and the method is capable to resolve and reconstruct layers individually. The feasibility of the method is validated by experiment on both "idealized" and "practical" multilayer samples, and the advantages in performance of the method are proven by quantitative comparison with conventional methods.
太赫兹焦平面阵列成像方法、直接相机成像和传统光场成像方法都无法分辨和分离多层物体的各层。本文针对具有不同反射特性的多层结构,旨在实现快速、高分辨率和层分辨成像,提出了一种基于太赫兹光场成像的新型角强度滤波(AIF)方法。该方法利用了四维光场的额外维度信息和成像物体的反射特性,能够单独分辨和重建各层。通过对“理想化”和“实际”多层样品进行实验验证了该方法的可行性,并通过与传统方法的定量比较证明了该方法在性能上的优势。