Chen Ping, Pan Jinbo, Gao Wenchao, Wan Bensong, Kong Xianghua, Cheng Yang, Liu Kaihui, Du Shixuan, Ji Wei, Pan Caofeng, Wang Zhong Lin
Center on Nanoenergy Research, School of Physical Science and Technology, Guangxi University, Nanning, 530004, China.
CAS Center for Excellence in Nanoscience, Beijing Key Laboratory of Micro-nano Energy and Sensor, Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, 100083, China.
Adv Mater. 2022 Feb;34(7):e2108615. doi: 10.1002/adma.202108615. Epub 2022 Jan 11.
Transition metal dichalcogenides (TMDCs) with 2H phase are expected to be building blocks in next-generation electronics; however, they suffer from electrical anisotropy, which is the basics for multi-terminal artificial synaptic devices, digital inverters, and anisotropic memtransistors, which are highly desired in neuromorphic computing. Herein, the anisotropic carrier mobility from 2H WSe is reported, where the anisotropic degree of carrier mobility spans from 0.16 to 0.95 for various WSe field-effect transistors under a gate voltage of -60 V. Phonon scattering, impurity ions scattering, and defect scattering are excluded for anisotropic mobility. An intrinsic screening layer is proposed and confirmed by Z-contrast scanning transmission electron microscopy (STEM) imaging to respond to the electrical anisotropy. Seven types of intrinsic screening layers are created and calculated by density functional theory to evaluate the modulated electronic structures, effective masses, and scattering intensities, resulting in anisotropic mobility. The discovery of anisotropic carrier mobility from 2H WSe provides a degree of freedom for adjusting the physical properties of 2H TMDCs and fertile ground for exploring and integrating TMDC electronic transistors with better performance along the direction of high mobility.
具有2H相的过渡金属二硫属化物(TMDCs)有望成为下一代电子产品的基础材料;然而,它们存在电各向异性问题,而电各向异性是多端人工突触器件、数字逆变器和各向异性忆阻器的基础,这些在神经形态计算中是非常需要的。在此,报道了2H相WSe2的各向异性载流子迁移率,在-60 V的栅极电压下,各种WSe2场效应晶体管的载流子迁移率各向异性程度在0.16至0.95之间。各向异性迁移率排除了声子散射、杂质离子散射和缺陷散射。提出了一种本征屏蔽层,并通过Z衬度扫描透射电子显微镜(STEM)成像得到证实,以解释电各向异性。通过密度泛函理论创建并计算了七种本征屏蔽层,以评估调制后的电子结构、有效质量和散射强度,从而得到各向异性迁移率。2H相WSe2各向异性载流子迁移率的发现为调节2H相TMDCs的物理性质提供了一个自由度,并为探索和集成沿高迁移率方向具有更好性能的TMDC电子晶体管提供了肥沃的土壤。