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超快电子显微镜中的阴极发光

Cathodoluminescence in Ultrafast Electron Microscopy.

作者信息

Kim Ye-Jin, Kwon Oh-Hoon

机构信息

Department of Chemistry, College of Natural Sciences, Ulsan National Institute of Science and Technology, Ulsan 44919, Korea.

Center for Soft and Living Matter, Institute for Basic Science (IBS), Ulsan 44919, Korea.

出版信息

ACS Nano. 2021 Dec 28;15(12):19480-19489. doi: 10.1021/acsnano.1c06260. Epub 2021 Dec 13.

DOI:10.1021/acsnano.1c06260
PMID:34894669
Abstract

Implementing the modern technologies of light-emitting devices, light harvesting, and quantum information processing requires the understanding of the structure-function relations at spatial scales below the optical diffraction limit and time scales of energy and information flows. Here, we distinctively combine cathodoluminescence (CL) with ultrafast electron microscopy (UEM), termed CL-UEM, because CL and UEM synergetically afford the required spectral and spatiotemporal sensitivities, respectively. For color centers in nanodiamonds, we demonstrate the measurement of CL lifetime with a local sensitivity of 50 nm and a time resolution of 100 ps. It is revealed that the emitting states of the color centers can be populated through charge transfer among the color centers across diamond lattices upon high-energy electron beam excitation. The technical advance achieved in this study will facilitate the specific control over energy conversion at nanoscales, relevant to quantum dots and single-photon sources.

摘要

要实现发光器件、光捕获和量子信息处理等现代技术,需要在低于光学衍射极限的空间尺度以及能量和信息流的时间尺度上理解结构-功能关系。在这里,我们将阴极发光(CL)与超快电子显微镜(UEM)独特地结合起来,称为CL-UEM,因为CL和UEM分别协同提供所需的光谱和时空灵敏度。对于纳米金刚石中的色心,我们展示了以50 nm的局域灵敏度和100 ps的时间分辨率测量CL寿命。结果表明,在高能电子束激发下,色心的发射态可通过金刚石晶格上色心之间的电荷转移来填充。本研究取得的技术进展将有助于对与量子点和单光子源相关的纳米尺度能量转换进行特定控制。

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