Xu Xiaobao, Han Zeyao, Zou Yousheng, Li Junyu, Gu Yu, Hu Dawei, He Yin, Liu Jiaxin, Yu Dejian, Cao Fei, Zeng Haibo
Key Laboratory of Advanced Display Materials and Devices, Ministry of Industry and Information Technology, Institute of Optoelectronics & Nanomaterials, School of Material Science and Engineering, Nanjing University of Science and Technology, Nanjing, 210094, China.
SZU-NUS Collaborative Innovation Center for Optoelectronic Science & Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, 518060, China.
Adv Mater. 2022 Mar;34(9):e2108408. doi: 10.1002/adma.202108408. Epub 2022 Jan 21.
Miniaturized multispectral detectors are urgently desired given the unprecedented prosperity of smart optoelectronic chips for integrated functions including communication, imaging, scientific analysis, etc. However, multispectral detectors require complicated prism optics or interference/interferometric filters for spectral recognition, which hampers the miniaturization and their subsequent integration in photonic integrated circuits. In this work, inspired by the advance of computational imaging, optical-component-free miniaturized multispectral detector on 4 mm gradient bandgap MAPbX microwire with a diameter of 30 µm, is reported. With accurate composition engineering, halide ions in MAPbX microwire vary from Cl to I giving in the gradual variation of optical bandgap from 2.96 to 1.68 eV along axis. The sensing units on MAPbX microwire offer the response edge ranging from 450 to 790 nm with the responsivity over 20 mA W , -3dB width over 450 Hz, LDR of ≈60 dB, and a noise current less than ≈1.4 × 10 A Hz . As a result, the derived miniaturized detector achieves the function of multispectral sensing and discrimination with spectral resolution of ≈25 nm and mismatch of ≈10 nm. Finally, the proof-of-concept colorful imaging is successfully conducted with the miniaturized multispectral detector to further confirm its application in spectral recognition.
鉴于智能光电芯片在通信、成像、科学分析等集成功能方面的空前繁荣，人们迫切需要小型化的多光谱探测器。然而，多光谱探测器需要复杂的棱镜光学器件或干涉/干涉滤光片来进行光谱识别，这阻碍了其小型化以及随后在光子集成电路中的集成。在这项工作中，受计算成像技术进步的启发，报道了一种基于直径为30 µm的4 mm梯度带隙MAPbX微线的无光学元件小型化多光谱探测器。通过精确的成分工程，MAPbX微线中的卤化物离子从Cl变化到I，导致光学带隙沿轴从2.96 eV逐渐变化到1.68 eV。MAPbX微线上的传感单元提供的响应边缘范围为450至790 nm，响应率超过20 mA W ，-3dB带宽超过450 Hz，LDR约为60 dB，噪声电流小于约1.4×10 A Hz 。结果，所得到的小型化探测器实现了多光谱传感和鉴别功能，光谱分辨率约为25 nm，失配约为10 nm。最后，使用小型化多光谱探测器成功进行了概念验证彩色成像，以进一步确认其在光谱识别中的应用。
