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单层黑磷纳米器件性能中的能带结构和尺寸缩放效应

Bandstructure and Size-Scaling Effects in the Performance of Monolayer Black Phosphorus Nanodevices.

作者信息

Poljak Mirko, Matić Mislav

机构信息

Computational Nanoelectronics Group, Faculty of Electrical Engineering and Computing, University of Zagreb, HR 10000 Zagreb, Croatia.

出版信息

Materials (Basel). 2021 Dec 29;15(1):243. doi: 10.3390/ma15010243.

DOI:10.3390/ma15010243
PMID:35009387
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8746210/
Abstract

Nanodevices based on monolayer black phosphorus or phosphorene are promising for future electron devices in high density integrated circuits. We investigate bandstructure and size-scaling effects in the electronic and transport properties of phosphorene nanoribbons (PNRs) and the performance of ultra-scaled PNR field-effect transistors (FETs) using advanced theoretical and computational approaches. Material and device properties are obtained by non-equilibrium Green's function (NEGF) formalism combined with a novel tight-binding (TB) model fitted on ab initio density-functional theory (DFT) calculations. We report significant changes in the dispersion, number, and configuration of electronic subbands, density of states, and transmission of PNRs with nanoribbon width () downscaling. In addition, the performance of PNR FETs with 15 nm-long channels are self-consistently assessed by exploring the behavior of charge density, quantum capacitance, and average charge velocity in the channel. The dominant consequence of downscaling is the decrease of charge velocity, which in turn deteriorates the ON-state current in PNR FETs with narrower nanoribbon channels. Nevertheless, we find optimum nanodevices with > 1.4 nm that meet the requirements set by the semiconductor industry for the "3 nm" technology generation, which illustrates the importance of properly accounting bandstructure effects that occur in sub-5 nm-wide PNRs.

摘要

基于单层黑磷或磷烯的纳米器件在未来高密度集成电路的电子器件方面颇具前景。我们使用先进的理论和计算方法,研究了磷烯纳米带(PNR)的电子和输运性质中的能带结构及尺寸缩放效应,以及超缩放PNR场效应晶体管(FET)的性能。通过非平衡格林函数(NEGF)形式主义结合基于从头算密度泛函理论(DFT)计算拟合的新型紧束缚(TB)模型,获得了材料和器件特性。我们报告了随着纳米带宽度()缩小,PNR的色散、电子子带数量和构型、态密度以及传输发生的显著变化。此外,通过探索15nm长沟道的PNR FET沟道中的电荷密度、量子电容和平均电荷速度行为,自洽地评估了其性能。缩小的主要后果是电荷速度降低,这反过来又会使具有更窄纳米带沟道的PNR FET中的导通态电流恶化。然而,我们发现当>1.4nm时存在满足半导体行业对“3nm”技术代所设定要求的最佳纳米器件,这说明了正确考虑5nm以下宽度PNR中出现的能带结构效应的重要性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/49f2b6cfac66/materials-15-00243-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/9baf7e41865b/materials-15-00243-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/f540eab51395/materials-15-00243-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/895658c14109/materials-15-00243-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/87f7e6f4f30d/materials-15-00243-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/44c9e41206cb/materials-15-00243-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/5d308bb797fe/materials-15-00243-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/49f2b6cfac66/materials-15-00243-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/9baf7e41865b/materials-15-00243-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/f540eab51395/materials-15-00243-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/895658c14109/materials-15-00243-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/87f7e6f4f30d/materials-15-00243-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/44c9e41206cb/materials-15-00243-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/5d308bb797fe/materials-15-00243-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/916f/8746210/49f2b6cfac66/materials-15-00243-g007.jpg

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