Jõgiaas Taivo, Tarre Aivar, Mändar Hugo, Kozlova Jekaterina, Tamm Aile
Department of Materials Science, Institute of Physics, University of Tartu, W. Ostwald Str. 1, 50411 Tartu, Estonia.
Nanomaterials (Basel). 2021 Dec 29;12(1):82. doi: 10.3390/nano12010082.
Chromium (III) oxide is a technologically interesting material with attractive chemical, catalytic, magnetic and mechanical properties. It can be produced by different chemical and physical methods, for instance, by metal-organic chemical vapor deposition, thermal decomposition of chromium nitrate Cr(NO) or ammonium dichromate (NH)CrO, magnetron sputtering and atomic layer deposition. The latter method was used in the current work to deposit CrO thin films with thicknesses from 28 to 400 nm at deposition temperatures from 330 to 465 °C. The phase composition, crystallite size, hardness and modulus of elasticity were measured. The deposited CrO thin films had different structures from X-ray amorphous to crystalline α-CrO (eskolaite) structures. The averaged hardness of the films on SiO glass substrate varied from 12 to 22 GPa and the moduli were in the range of 76-180 GPa, as determined by nanoindentation. Lower values included some influence from a softer deposition substrate. The results indicate that CrO could be a promising material as a mechanically protective thin film applicable, for instance, in micro-electromechanical devices.
三氧化二铬是一种在技术方面具有吸引力的材料,具有引人注目的化学、催化、磁和机械性能。它可以通过不同的化学和物理方法制备,例如,通过金属有机化学气相沉积、硝酸铬Cr(NO)或重铬酸铵(NH)CrO的热分解、磁控溅射和原子层沉积。在当前工作中采用了后一种方法,在330至465°C的沉积温度下沉积厚度为28至400nm的CrO薄膜。测量了其相组成、微晶尺寸、硬度和弹性模量。沉积的CrO薄膜具有从X射线非晶到结晶α-CrO(铬绿)结构的不同结构。通过纳米压痕测定,SiO玻璃基板上薄膜的平均硬度在12至22GPa之间变化,模量在76 - 180GPa范围内。较低的值包括来自较软沉积基板的一些影响。结果表明,CrO作为一种机械保护薄膜可能是一种有前途的材料,例如适用于微机电装置。