一种基于光学频域反射仪（OFDR）的光纤杨氏模量无损测量方法。

A Nondestructive Measurement Method of Optical Fiber Young's Modulus Based on OFDR.

作者信息

Li Pengfei, Fu Cailing, Zhong Huajian, Du Bin, Guo Kuikui, Meng Yanjie, Du Chao, He Jun, Wang Lei, Wang Yiping

机构信息

Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education/Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China.

Shenzhen Key Laboratory of Photonic Devices and Sensing Systems for Internet of Tings, Guangdong and Hong Kong Joint Research Centre for Optical Fibre Sensors, Shenzhen University, Shenzhen 518060, China.

出版信息

Sensors (Basel). 2022 Feb 14;22(4):1450. doi: 10.3390/s22041450.

DOI:10.3390/s22041450

PMID:35214352

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8878550/

Abstract

A nondestructive measurement method based on an Optical frequency domain reflectometry (OFDR) was demonstrated to achieve Young's modulus of an optical fiber. Such a method can be used to measure, not only the averaged Young's modulus within the measured fiber length, but also Young's modulus distribution along the optical fiber axis. Moreover, the standard deviation of the measured Young's modulus is calculated to analyze the measurement error. Young's modulus distribution of the coated and uncoated single mode fiber (SMF) samples was successfully measured along the optical fiber axis. The average Young's modulus of the coated and uncoated SMF samples was 13.75 ± 0.14, and 71.63 ± 0.43 Gpa, respectively, within the measured fiber length of 500 mm. The measured Young's modulus distribution along the optical fiber axis could be used to analyze the damage degree of the fiber, which is very useful to nondestructively estimate the service life of optical fiber sensors immersed into smart engineer structures.

摘要

一种基于光频域反射法（OFDR）的无损测量方法被证明可用于获取光纤的杨氏模量。这种方法不仅可以测量被测光纤长度内的平均杨氏模量，还能测量沿光纤轴的杨氏模量分布。此外，通过计算所测杨氏模量的标准差来分析测量误差。成功测量了涂覆和未涂覆单模光纤（SMF）样品沿光纤轴的杨氏模量分布。在500毫米的被测光纤长度内，涂覆和未涂覆SMF样品的平均杨氏模量分别为13.75±0.14和71.63±0.43吉帕。沿光纤轴测得的杨氏模量分布可用于分析光纤的损伤程度，这对于无损估计浸入智能工程结构中的光纤传感器的使用寿命非常有用。