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静电放电脉冲辐照下航天器典型介电材料的感应静电放电研究

Research on the Induced Electrostatic Discharge of Spacecraft Typical Dielectric Materials under the ESD Pulse Irradiation.

作者信息

Hu Xiaofeng, Zhang Jianping, Wei Ming, Wang Yingying

机构信息

National Key Laboratory of Electromagnetic Environmental Effects, Army Engineering University, Shijiazhuang 050003, China.

Unit 32140 of PLA, Shijiazhuang 050061, China.

出版信息

Materials (Basel). 2022 Mar 13;15(6):2115. doi: 10.3390/ma15062115.

DOI:10.3390/ma15062115
PMID:35329567
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8955968/
Abstract

Based on polyimide (PI), epoxy resin (EP), polytetrafluoroethylene (PTFE) typical dielectric materials used in spacecraft, a research platform for charge-discharge experiment under strong field was established. The influence of irradiation field strength, beam energy, dielectric thickness, etc., on electrostatic discharge characters of dielectric materials were studied and summarized. The results show that with the increase of field strength, the frequency of induced electrostatic discharge increases, the accumulated charge on the dielectric surface decreases, and the dielectric surface potential decreases; Under the same conditions, PI has the lowest discharge frequency and the highest surface dynamic balance potential. The thicker the dielectric material, the lower the discharge frequency, the higher the surface dynamic equilibrium potential; The shape and size of the background electrodes also affect the discharge frequency. When the area is the same, the sharper the electrode edge, the higher the discharge frequency. When the shape is the same, the larger the grounding area, the higher the discharge frequency. By proposing the induced discharge test method, the function mechanism of spatial environmental factors on the electrostatic discharge of typical dielectric materials are obtained. Comparative analysis on electrostatic properties of different dielectric materials can provide data reference and technical support for spacecraft electrostatic safety and protection.

摘要

基于航天器中使用的聚酰亚胺(PI)、环氧树脂(EP)、聚四氟乙烯(PTFE)等典型介电材料,搭建了强场充放电实验研究平台。研究并总结了辐照场强、束流能量、介质厚度等对介电材料静电放电特性的影响。结果表明:随着场强的增加,感应静电放电频率增加,介质表面积累电荷减少,介质表面电位降低;在相同条件下,PI的放电频率最低,表面动态平衡电位最高。介电材料越厚,放电频率越低,表面动态平衡电位越高;背景电极的形状和尺寸也会影响放电频率。面积相同时,电极边缘越尖锐,放电频率越高。形状相同时,接地面积越大,放电频率越高。通过提出感应放电测试方法,得到了空间环境因素对典型介电材料静电放电的作用机制。对不同介电材料静电性能的对比分析可为航天器静电安全与防护提供数据参考和技术支持。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/6fe420e95017/materials-15-02115-g014.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/07175f71d730/materials-15-02115-g001.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/d85d9af1e3d6/materials-15-02115-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/1059e3a68607/materials-15-02115-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/381f0637db76/materials-15-02115-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/c7a78f8370b4/materials-15-02115-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/67afd30cf9df/materials-15-02115-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/cfcc5f6c239e/materials-15-02115-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/6f01c3e82fd7/materials-15-02115-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/243328e5a3ba/materials-15-02115-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/a11e87d9fbcd/materials-15-02115-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/07295aa2e316/materials-15-02115-g013.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/6fe420e95017/materials-15-02115-g014.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/07175f71d730/materials-15-02115-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/4e8e4d14b03b/materials-15-02115-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/541a4a6fdbb3/materials-15-02115-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/d85d9af1e3d6/materials-15-02115-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/1059e3a68607/materials-15-02115-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/381f0637db76/materials-15-02115-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/c7a78f8370b4/materials-15-02115-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/67afd30cf9df/materials-15-02115-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/cfcc5f6c239e/materials-15-02115-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/6f01c3e82fd7/materials-15-02115-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/243328e5a3ba/materials-15-02115-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/a11e87d9fbcd/materials-15-02115-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/07295aa2e316/materials-15-02115-g013.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c2ef/8955968/6fe420e95017/materials-15-02115-g014.jpg

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