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基于红外热成像仪应用主动辐射测量涂层发射率的方法研究

Study on Method for Measuring Coating Emissivity by Applying Active Irradiation Based on Infrared Thermal Imager.

作者信息

Li Yiwen, Zhang Puyousen, Chen Ge, Li Yao, Hua Weizhuo, Li Yuqin, Jiao Zhaoqiang

机构信息

Science and Technology on Plasma Dynamics Laboratory, Air Force Engineering University, Xi'an 710038, China.

出版信息

Sensors (Basel). 2022 Mar 20;22(6):2392. doi: 10.3390/s22062392.

Abstract

To achieve rapid and precise non-contact measurements of coating emissivity at room temperature, a measurement method based on infrared thermal imager was proposed. By applying two irradiations with different energies to the target and reference surfaces, the influences of atmospheric transmittance, radiation of the target itself, environmental radiation, and atmospheric path radiation were eliminated, thereby enabling accurate emissivity measurement. Experiments were designed for validation with a mid-wave infrared thermal imager and a surface blackbody as the radiation source. Several combinations of irradiation energy were set to investigate the effects of average energy and energy difference between the two irradiations on the measured results. The normal emissivity of the coated sample plate in the mid-wave band was measured to generate the image of coating surface emissivity. Then, the emissivity measurement results of the proposed method were compared with those of the energy method and the point emissivity measuring instrument under the same conditions, and the comparison indicated that the proposed method can effectively measure the emissivity of coating. Some factors causing measurement errors were analyzed. Finally, an experiment was designed to compare the measurement speed between the proposed method and the currently used methods, and the experimental results were analyzed.

摘要

为实现室温下涂层发射率的快速、精确非接触测量,提出了一种基于红外热成像仪的测量方法。通过对目标表面和参考表面施加两种不同能量的辐照,消除了大气透过率、目标自身辐射、环境辐射和大气路径辐射的影响,从而能够进行精确的发射率测量。设计了以中波红外热成像仪和表面黑体作为辐射源的实验进行验证。设置了几种辐照能量组合,以研究两种辐照的平均能量和能量差对测量结果的影响。测量了涂层样品板在中波波段的法向发射率,生成了涂层表面发射率图像。然后,将该方法的发射率测量结果与能量法和点发射率测量仪在相同条件下的测量结果进行比较,比较结果表明该方法能够有效测量涂层的发射率。分析了一些导致测量误差的因素。最后,设计了一个实验来比较该方法与当前使用方法之间的测量速度,并对实验结果进行了分析。

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