Wiegmann Tim, Pacheco Ivan, Reikowski Finn, Stettner Jochim, Qiu Canrong, Bouvier Mathilde, Bertram Manon, Faisal Firas, Brummel Olaf, Libuda Jörg, Drnec Jakub, Allongue Philippe, Maroun Fouad, Magnussen Olaf M
Institute of Experimental and Applied Physics, Kiel University, 24118 Kiel, Germany.
Laboratoire de Physique de la Matière Condensée (PMC), CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 91120 Palaiseau, France.
ACS Catal. 2022 Mar 18;12(6):3256-3268. doi: 10.1021/acscatal.1c05169. Epub 2022 Feb 24.
Co oxides and oxyhydroxides have been studied extensively in the past as promising electrocatalysts for the oxygen evolution reaction (OER) in neutral to alkaline media. Earlier studies showed the formation of an ultrathin CoO (OH) skin layer on CoO at potentials above 1.15 V vs reversible hydrogen electrode (RHE), but the precise influence of this skin layer on the OER reactivity is still under debate. We present here a systematic study of epitaxial spinel-type CoO films with defined (111) orientation, prepared on different substrates by electrodeposition or physical vapor deposition. The OER overpotential of these samples may vary up to 120 mV, corresponding to two orders of magnitude differences in current density, which cannot be accounted for by differences in the electrochemically active surface area. We demonstrate by a careful analysis of surface X-ray diffraction measurements that these differences are clearly correlated with the average thickness of the skin layer. The OER reactivity increases with the amount of formed skin layer, indicating that the entire three-dimensional skin layer is an OER-active interphase. Furthermore, a scaling relationship between the reaction centers in the skin layer and the OER activity is established. It suggests that two lattice sites are involved in the OER mechanism.
过去,氧化钴和羟基氧化物作为中性至碱性介质中析氧反应(OER)的有前景的电催化剂受到了广泛研究。早期研究表明,在相对于可逆氢电极(RHE)高于1.15 V的电位下,CoO上会形成超薄的CoO(OH)表层,但该表层对OER反应活性的确切影响仍存在争议。我们在此展示了对通过电沉积或物理气相沉积在不同衬底上制备的具有确定(111)取向的外延尖晶石型CoO薄膜的系统研究。这些样品的OER过电位可能相差高达120 mV,对应于电流密度两个数量级的差异,这不能用电化学活性表面积的差异来解释。我们通过对表面X射线衍射测量的仔细分析表明,这些差异与表层的平均厚度明显相关。OER反应活性随形成的表层量增加而增加,表明整个三维表层是一个OER活性界面相。此外,还建立了表层中反应中心与OER活性之间的标度关系。这表明OER机制涉及两个晶格位点。