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通过三维X射线计算机显微断层扫描研究深层过滤实验中胶体沉积物的联合束硬化伪影校正和定量微观分析。

Combined beam hardening artifact correction and quantitative microanalysis of colloidal depositions in deep bed filtration experiments investigated by 3D X-ray computed microtomography.

作者信息

Ilzig Thomas, Günther Stefan, Odenbach Stefan

机构信息

TU Dresden, Chair of Magnetofluiddynamics, Measuring and Automation Technology, George-Bähr-Straße 3, 01069Dresden, Germany.

TU Dresden, Chair of Magnetofluiddynamics, Measuring and Automation Technology, George-Bähr-Straße 3, 01069Dresden, Germany.

出版信息

Micron. 2022 Jul;158:103265. doi: 10.1016/j.micron.2022.103265. Epub 2022 Mar 31.

Abstract

In this study we present quantitative X-ray computed microtomography measurements (μCT) of retained sub-micron-sized particles in open porous media carried out in a laboratory μCT setup. Due to the polychromatic spectrum of the used X-rays, the tomograms are affected by various non-linear artifacts, which belong to the class of beam hardening artifacts. These artifacts become more dominant, when the amount of retained particles increases and can affect wide areas of the images, making a qualitative and quantitative analysis barely possible. Furthermore, the colloidal depositions show an inhomogeneous distribution inside the filter, making a reliable material discrimination between filter and particle material challenging. We introduce a calibration method, which is capable to sufficiently remove the majority of the artifacts by linearization of the projection data and thus enabling the precise material quantification of the retained colloids in the reconstructed tomograms. While most beam hardening correction routines are only applicable to homogeneous materials, our algorithm takes into account inhomogeneous material distributions and is adapted to multi-material systems. Moreover, the method includes a material discrimination of the colloids and the filter in the raw data domain. Thus, erroneous segmentations at the interfaces between different material fractions are avoided. As a result we present quantitative concentration maps of the particle distribution inside the porous media with a resolution of < 10μm. A series of validation samples was prepared, covering a wide range of different, representative filter loading stages. The accuracy of the particle quantification was evaluated from these samples and the relative deviation of the overall contained particle mass was less than 10% in all cases, partially even less than 1%. The overall image quality due to the artifact removal was significantly improved. The local variation of the particle concentration could be well assessed from the obtained concentration maps.

摘要

在本研究中,我们展示了在实验室μCT装置中对开放多孔介质中保留的亚微米级颗粒进行的定量X射线计算机显微断层扫描测量(μCT)。由于所用X射线的多色光谱,断层图像受到各种非线性伪影的影响,这些伪影属于束硬化伪影类别。当保留颗粒的数量增加时,这些伪影变得更加明显,并会影响图像的大片区域,使得定性和定量分析几乎无法进行。此外,胶体沉积物在过滤器内部呈现不均匀分布,这使得在过滤器和颗粒材料之间进行可靠的材料区分具有挑战性。我们引入了一种校准方法,该方法能够通过对投影数据进行线性化来充分去除大部分伪影,从而能够对重建断层图像中保留的胶体进行精确的材料定量。虽然大多数束硬化校正程序仅适用于均匀材料,但我们的算法考虑了不均匀的材料分布,并适用于多材料系统。此外,该方法包括在原始数据域中对胶体和过滤器进行材料区分。因此,避免了不同材料部分之间界面处的错误分割。结果,我们展示了多孔介质内部颗粒分布的定量浓度图,分辨率小于10μm。制备了一系列验证样品,涵盖了广泛的不同代表性过滤器负载阶段。从这些样品中评估了颗粒定量的准确性,在所有情况下,总体所含颗粒质量的相对偏差均小于10%,部分甚至小于1%。由于去除了伪影,整体图像质量得到了显著改善。从获得的浓度图中可以很好地评估颗粒浓度的局部变化。

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