Rajh Ava, Arčon Iztok, Bučar Klemen, Žitnik Matjaž, Petric Marko, Vizintin Alen, Bitenc Jan, Košir Urban, Dominko Robert, Gretarsson Hlynur, Sundermann Martin, Kavčič Matjaž
Jožef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia.
University of Ljubljana, Faculty of Mathematics and Physics, Jadranska ulica 19, 1000 Ljubljana, Slovenia.
J Phys Chem C Nanomater Interfaces. 2022 Mar 31;126(12):5435-5442. doi: 10.1021/acs.jpcc.1c10622. Epub 2022 Mar 16.
X-ray Raman spectroscopy (XRS) is an emerging spectroscopic technique that utilizes inelastic scattering of hard X-rays to study X-ray absorption edges of low Z elements in bulk material. It was used to identify and quantify the amount of carbonyl bonds in a cathode sample, in order to track the redox reaction inside metal-organic batteries during the charge/discharge cycle. XRS was used to record the oxygen K-edge absorption spectra of organic polymer cathodes from different multivalent metal-organic batteries. The amount of carbonyl bond in each sample was determined by modeling the oxygen K-edge XRS spectra with the linear combination of two reference compounds that mimicked the fully charged and the fully discharged phases of the battery. To interpret experimental XRS spectra, theoretical calculations of oxygen K-edge absorption spectra based on density functional theory were performed. Overall, a good agreement between the amount of carbonyl bond present during different stages of battery cycle, calculated from linear combination of standards, and the amount obtained from electrochemical characterization based on measured capacity was achieved. The electrochemical mechanism in all studied batteries was confirmed to be a reduction of double carbonyl bond and the intermediate anion was identified with the help of theoretical calculations. X-ray Raman spectroscopy of the oxygen K-edge was shown to be a viable characterization technique for accurate tracking of the redox reaction inside metal-organic batteries.
X射线拉曼光谱(XRS)是一种新兴的光谱技术,它利用硬X射线的非弹性散射来研究块状材料中低Z元素的X射线吸收边。它被用于识别和量化阴极样品中羰基键的数量,以便追踪金属有机电池在充放电循环过程中的氧化还原反应。XRS被用于记录来自不同多价金属有机电池的有机聚合物阴极的氧K边吸收光谱。通过用模拟电池完全充电和完全放电阶段的两种参考化合物的线性组合对氧K边XRS光谱进行建模,确定了每个样品中羰基键的数量。为了解释实验XRS光谱,基于密度泛函理论进行了氧K边吸收光谱的理论计算。总体而言,从标准物的线性组合计算出的电池循环不同阶段存在的羰基键数量与基于测量容量的电化学表征获得的数量之间取得了良好的一致性。所有研究电池中的电化学机制被确认为双羰基键的还原,并借助理论计算确定了中间阴离子。氧K边的X射线拉曼光谱被证明是一种可行的表征技术,可用于精确追踪金属有机电池内部的氧化还原反应。