Somov Pavel A, Statnik Eugene S, Kan Yuliya, Pisarev Vladimir S, Eleonsky Svyatoslav I, Ozherelkov Dmitry Yu, Salimon Alexey I
HSM Laboratory, Skoltech, 121205 Moscow, Russia.
Central Aero-Hydrodynamics Institute Named after Prof. N.E. Zhukovsky (TsAGI), 140180 Zhukovsky, Russia.
Nanomaterials (Basel). 2022 Apr 6;12(7):1235. doi: 10.3390/nano12071235.
Ga-ion micro-ring-core FIB-DIC evaluation of residual stresses in shot peened VT6 (Ti-6Al-4V) alloy was carried out and cross-validated against other non-destructive and semi-destructive residual stresses evaluation techniques, namely, the conventional sin2ψ X-ray diffraction and mechanical hole drilling. The Korsunsky FIB-DIC method of Ga-ion beam micro-ring-core milling within FIB-SEM with Digital Image Correlation (DIC) deformation analysis delivered spatial resolution down to a few micrometers, while the mechanical drilling of circular holes of ~2 mm diameter with laser speckle interferometry monitoring of strains gave a rough spatial resolution of a few millimeters. Good agreement was also found with the X-ray diffraction estimates of residual stress variation profiles as a function of depth. These results demonstrate that FIB-DIC provides rich information down to the micron scale, it also allows reliable estimation of macro-scale residual stresses.
对喷丸处理的VT6（Ti-6Al-4V）合金中的残余应力进行了镓离子微环芯FIB-DIC评估，并与其他无损和半无损残余应力评估技术进行了交叉验证，即传统的sin2ψX射线衍射和机械钻孔。在具有数字图像相关（DIC）变形分析的FIB-SEM内，采用镓离子束微环芯铣削的Korsunsky FIB-DIC方法可提供低至几微米的空间分辨率，而用激光散斑干涉法监测应变对直径约2毫米的圆孔进行机械钻孔，可得到几毫米的粗略空间分辨率。在残余应力随深度变化的分布情况的X射线衍射估计方面也发现了良好的一致性。这些结果表明，FIB-DIC可提供低至微米尺度的丰富信息，还能可靠地估计宏观尺度的残余应力。
