Zhu Yihua, Fried Daniel
University of California, San Francisco, San Francisco, CA 94143-0758.
Proc SPIE Int Soc Opt Eng. 2022 Jan-Feb;11942. doi: 10.1117/12.2608288. Epub 2022 Mar 4.
We have developed a clinical probe capable of acquiring simultaneous, multispectral short wavelength infrared (SWIR) reflectance and occlusal transillumination images of lesions on tooth proximal and occlusal surfaces to reduce the potential of false positives and enhance diagnosis. The dual probe was 3D printed and the imaging system uses an InGaAs camera and broadband light sources at 1310 nm for occlusal transillumination and 1600 nm for cross-polarization reflectance measurements. In this study a mathematical model to estimate the penetration depth of "hidden" occlusal lesions from the SWIR images was developed. We compared the model's estimated lesion depth on 18 extracted teeth with lesions against microCT measurements. Although the model estimated depth deviates from that measured in microCT at higher depths, there is a good linear correlation (R = 0.93) between the estimated depth from SWIR images and the measured depth using microCT. SWIR occlusal transillumination images at 1300 nm also provide information about interproximal lesion penetration depth which can be directly viewed from the occlusal surface. SWIR occlusal transillumination and reflectance depth measurements on 49 natural interproximal lesions were compared with microCT measurements. There was significant correlation between the depths measured with SWIR occlusal transillumination (R = 0.81) and reflectance (R = 0.19) compared with the depths measured with microCT.
我们开发了一种临床探针,能够同时获取牙齿近中面和咬合面病变的多光谱短波红外(SWIR)反射率和咬合透照图像,以降低假阳性的可能性并加强诊断。这种双探头是通过3D打印制作的,成像系统使用一台铟镓砷相机和宽带光源,其中1310 nm的光源用于咬合透照,1600 nm的光源用于交叉偏振反射率测量。在本研究中,我们开发了一个数学模型,用于从SWIR图像估计“隐匿性”咬合病变的穿透深度。我们将该模型对18颗有病变的离体牙估计的病变深度与显微CT测量结果进行了比较。尽管在较深深度时模型估计深度与显微CT测量深度存在偏差,但SWIR图像估计深度与显微CT测量深度之间存在良好的线性相关性(R = 0.93)。1300 nm的SWIR咬合透照图像还提供了关于邻面病变穿透深度的信息,可从咬合面直接观察到。我们将49例天然邻面病变的SWIR咬合透照和反射深度测量结果与显微CT测量结果进行了比较。与显微CT测量的深度相比,SWIR咬合透照测量的深度(R = 0.81)和反射测量的深度(R = 0.19)之间存在显著相关性。