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使用不同光谱技术对低大气细颗粒物(PM)进行多元素分析的统计比较。

A statistic comparison of multi-element analysis of low atmospheric fine particles (PM) using different spectroscopy techniques.

作者信息

Zhi Minkang, Zhang Kai, Zhang Xi, Herrmann Hartmut, Gao Jian, Fomba Khanneh Wadinga, Tang Wei, Luo Yuqian, Li Huanhuan, Meng Fan

机构信息

State Key Laboratory of Environmental Criteria and Risk Assessment, Chinese Research Academy of Environmental Sciences, Beijing 100012, China.

State Key Laboratory of Environmental Criteria and Risk Assessment, Chinese Research Academy of Environmental Sciences, Beijing 100012, China.

出版信息

J Environ Sci (China). 2022 Apr;114:194-203. doi: 10.1016/j.jes.2021.08.034. Epub 2022 Jan 14.

DOI:10.1016/j.jes.2021.08.034
PMID:35459484
Abstract

Over the past few decades, the metal elements (MEs) in atmospheric particles have aroused great attention. Some well-established techniques have been used to measure particle-bound MEs. However, each method has its own advantages and disadvantages in terms of complexity, accuracy, and specific elements of interest. In this study, the performances of inductively coupled plasma-optical emission spectrometry (ICP-OES) and total reflection X-ray fluorescence spectroscopy (TXRF) were evaluated for quality control to analyze data accuracy and precision. The statistic methods (Deming regression and significance testing) were applied for intercomparison between ICP-OES and TXRF measurements for same low-loading PM samples in Weizhou Island. The results from the replicate analysis of standard filters (SRM 2783) and field filters samples indicated that 10 MEs (K, Ca, V, Cr, Mn, Fe, Ni, Cu, Zn, and Pb) showed good accuracies and precision for both techniques. The higher accuracy tended to the higher precision in the MEs analysis process. In addition, the interlab comparisons illustrated that V and Mn all had good agreements between ICP-OES and TXRF. The measurements of K, Cu and Zn were more reliable by TXRF analysis for low-loading PM. ICP-OES was more accurate for the determinations for Ca, Cr, Ni and Pb, owing to the overlapping spectral lines and low sensitivity during TXRF analysis. The measurements of Fe, influenced by low-loading PM, were not able to determine which instrument could obtain more reliable results. These conclusions could provide reference information to choose suitable instrument for the determination of MEs in low-loading PM samples.

摘要

在过去几十年中,大气颗粒物中的金属元素(MEs)引起了广泛关注。一些成熟的技术已被用于测量与颗粒物结合的金属元素。然而,每种方法在复杂性、准确性和感兴趣的特定元素方面都有其自身的优缺点。在本研究中,评估了电感耦合等离子体发射光谱法(ICP - OES)和全反射X射线荧光光谱法(TXRF)的性能,以进行质量控制,分析数据的准确性和精密度。应用统计方法(戴明回归和显著性检验)对涠洲岛相同低负载PM样品的ICP - OES和TXRF测量结果进行比对。标准滤膜(SRM 2783)和现场滤膜样品的重复分析结果表明,对于两种技术,10种金属元素(钾、钙、钒、铬、锰、铁、镍、铜、锌和铅)均显示出良好的准确性和精密度。在金属元素分析过程中,较高的准确性往往伴随着较高的精密度。此外,实验室间比对表明,钒和锰在ICP - OES和TXRF之间均具有良好的一致性。对于低负载PM,TXRF分析对钾、铜和锌的测量更可靠。由于TXRF分析过程中的谱线重叠和低灵敏度,ICP - OES对钙、铬、镍和铅的测定更准确。受低负载PM影响,铁的测量无法确定哪种仪器能获得更可靠的结果。这些结论可为选择合适的仪器测定低负载PM样品中的金属元素提供参考信息。

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