Inoue Ichiro, Iwai Eito, Hara Toru, Inubushi Yuichi, Tono Kensuke, Yabashi Makina
RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.
J Synchrotron Radiat. 2022 May 1;29(Pt 3):862-865. doi: 10.1107/S1600577522001205. Epub 2022 Mar 21.
A simple spectrometer using diffraction from diamond microcrystals has been developed to diagnose single-shot spectra of X-ray free-electron laser (XFEL) pulses. The large grain size and uniform lattice constant of the adopted crystals enable characterizing the XFEL spectrum at a resolution of a few eV from the peak shape of the powder diffraction profile. This single-shot spectrometer has been installed at beamline 3 of SACLA and is used for daily machine tuning.
一种利用金刚石微晶衍射的简单光谱仪已被开发出来,用于诊断X射线自由电子激光(XFEL)脉冲的单次光谱。所采用晶体的大晶粒尺寸和均匀晶格常数使得能够根据粉末衍射图谱的峰形以几电子伏特的分辨率表征XFEL光谱。这种单次光谱仪已安装在SACLA的3号光束线上,并用于日常的机器调谐。