Engineering Product Development Pillar, Singapore University of Technology & Design, 8 Somapah Road, Singapore 487372, Singapore.
Department of Information Systems, Hanyang University, Seoul 133791, Korea.
Sensors (Basel). 2022 May 17;22(10):3803. doi: 10.3390/s22103803.
With smart electronic devices delving deeper into our everyday lives, predictive maintenance solutions are gaining more traction in the electronic manufacturing industry. It is imperative for the manufacturers to identify potential failures and predict the system/device's remaining useful life (RUL). Although data-driven models are commonly used for prognostic applications, they are limited by the necessity of large training datasets and also the optimization algorithms used in such methods run into local minima problems. In order to overcome these drawbacks, we train a Neural Network with Bayesian inference. In this work, we use Neural Networks (NN) as the prediction model and an adaptive Bayesian learning approach to estimate the RUL of electronic devices. The proposed prognostic approach functions in two stages-weight regularization using adaptive Bayesian learning and prognosis using NN. A Bayesian framework (particle filter algorithm) is adopted in the first stage to estimate the network parameters (weights and bias) using the NN prediction model as the state transition function. However, using a higher number of hidden neurons in the NN prediction model leads to particle weight decay in the Bayesian framework. To overcome the weight decay issues, we propose particle roughening as a weight regularization method in the Bayesian framework wherein a small Gaussian jitter is added to the decaying particles. Additionally, weight regularization was also performed by adopting conventional resampling strategies to evaluate the efficiency and robustness of the proposed approach and to reduce optimization problems commonly encountered in NN models. In the second stage, the estimated distributions of network parameters were fed into the NN prediction model to predict the RUL of the device. The lithium-ion battery capacity degradation data (CALCE/NASA) were used to test the proposed method, and RMSE values and execution time were used as metrics to evaluate the performance.
随着智能电子设备深入我们的日常生活,预测性维护解决方案在电子制造行业中越来越受到关注。制造商必须识别潜在故障并预测系统/设备的剩余使用寿命 (RUL)。虽然数据驱动模型常用于预测应用,但它们受到需要大型训练数据集的限制,并且此类方法中使用的优化算法也会遇到局部最小值问题。为了克服这些缺点,我们使用贝叶斯推断训练神经网络。在这项工作中,我们使用神经网络 (NN) 作为预测模型和自适应贝叶斯学习方法来估计电子设备的 RUL。所提出的预测方法分两个阶段运行-使用自适应贝叶斯学习进行权重正则化和使用 NN 进行预测。在第一阶段采用贝叶斯框架(粒子滤波算法),使用 NN 预测模型作为状态转移函数来估计网络参数(权重和偏差)。然而,在 NN 预测模型中使用更多的隐藏神经元会导致贝叶斯框架中的粒子权重衰减。为了克服权重衰减问题,我们提出了粒子粗糙化作为贝叶斯框架中的权重正则化方法,其中向衰减粒子添加小的高斯抖动。此外,还通过采用传统的重采样策略来进行权重正则化,以评估所提出方法的效率和鲁棒性,并减少 NN 模型中常见的优化问题。在第二阶段,将估计的网络参数分布输入到 NN 预测模型中,以预测设备的 RUL。使用锂离子电池容量退化数据 (CALCE/NASA) 来测试所提出的方法,并使用均方根误差 (RMSE) 值和执行时间作为指标来评估性能。