Samanta Krishnendu, Tiwari Anupriya, Joseph Shereena, Joseph Joby
Opt Lett. 2022 Jun 1;47(11):2702-2705. doi: 10.1364/OL.460502.
We propose a novel, to the best of our knowledge, super-resolution technique, namely saturable absorption assisted nonlinear structured illumination microscopy (SAN-SIM), by exploring the saturable absorption property of a material. In the proposed technique, the incident sinusoidal excitation is converted into a nonlinear illumination by propagating through a saturable absorbing material. The effective nonlinear illumination possesses higher harmonics which multiply fold high frequency components within the passband and hence offers more than two-fold resolution improvement over the diffraction limit. The theoretical background of the technique is presented, supported by the numerical results. The simulation is performed for both symmetric as well as random samples where the raw moiré frames are processed through a blind reconstruction approach developed for the nonlinear SIM. The results demonstrate the super-resolution capability of the proposed technique.
据我们所知，我们提出了一种新颖的超分辨率技术，即饱和吸收辅助非线性结构照明显微镜（SAN-SIM），通过探索一种材料的饱和吸收特性。在所提出的技术中，入射的正弦激励通过传播穿过饱和吸收材料而转换为非线性照明。有效的非线性照明具有更高的谐波，这些谐波在通带内成倍增加高频分量，因此比衍射极限提供了两倍以上的分辨率提升。给出了该技术的理论背景，并得到了数值结果的支持。对对称和随机样本都进行了模拟，其中原始莫尔条纹帧通过为非线性结构照明显微镜开发的盲重建方法进行处理。结果证明了所提出技术的超分辨率能力。
