Kübler O, Gross H, Moor H
Ultramicroscopy. 1978;3(2):161-8. doi: 10.1016/s0304-3991(78)80022-9.
Conventional freeze-etch replicas of the cytoplasmic fracture face (PF) of the yeast plasmalemma membrane show hexagonally ordered regions. Complementary features on the extraplasmic face (EF) could not be identified. Replicas with improved topographical resolution were obtained for both fracture faces by ultrahigh vacuum freeze-fracturing at -196 degrees C. The hexagonally ordered structure on the PF is seen to consist of volcano-like particles with a crater of 5 nm diameter. The lattice constant is 16.5 nm. On the EF, ring-like depressions corresponding to particles on the PF can occasionally be detected; the existence of ordered regions can be established by optical diffraction. Complementarity of periodic features on the PF and EF is demonstrated by digital image filtration. A main structure, coarse features of which appear on conventional PF replicas is shown to have perfect complementarity at a resolution level of 2 nm. On the EF an additional substructure, completely obscured on normal replicas, is revealed. Its complementarity remains tentative as shadows cast by the main structure impair identification of substructural features on the PF.
酵母质膜细胞质断裂面(PF)的传统冷冻蚀刻复制品显示出六边形有序区域。在质膜外表面(EF)上未发现互补特征。通过在-196℃下进行超高真空冷冻断裂,获得了两个断裂面具有更高地形分辨率的复制品。PF上的六边形有序结构由直径为5nm的火山状颗粒组成。晶格常数为16.5nm。在EF上,偶尔可以检测到与PF上颗粒相对应的环状凹陷;通过光学衍射可以确定有序区域的存在。通过数字图像过滤证明了PF和EF上周期性特征的互补性。在传统PF复制品上出现的主要结构的粗略特征在2nm分辨率水平上显示出完美的互补性。在EF上,揭示了一个在正常复制品上完全被掩盖的额外子结构。由于主要结构投射的阴影妨碍了对PF上子结构特征的识别,其互补性仍不确定。