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莫氏锥度种植体设计对种植体-愈合基台界面微渗漏的影响。

The impact of Morse taper implant design on microleakage at implant-healing abutment interface.

机构信息

Department of Oral Anatomy and Dental Research Institute, School of Dentistry, Seoul National University.

Center for Future Dentistry, School of Dentistry, Seoul National University.

出版信息

Dent Mater J. 2022 Oct 2;41(5):767-773. doi: 10.4012/dmj.2022-022. Epub 2022 Jul 20.

Abstract

The microbial leakage at the implant-abutment interface (IAI) is one cause of peri-implant infection that puts long-term implant stability at risk. The present study compared two types of Morse taper implants in terms of sealing performance at the implanthealing abutment interface. Three implant systems, one of which exhibited a partial face-contact design (TSO) and the other two a line-contact design (TSM and BLT), were analyzed in vitro using two quantitative implant leakage measuring techniques: air-injection pressure measurement test and microbial examination. An in-house-developed device was used to determine implant leakage by recording the initial drop in pressure while injecting air through the implant. The microbial examination measured the absorbances of culture mediums in which the inoculated implants were contained. Significant difference was found between the partial face- and line-contact groups (p<0.001). Both tests revealed that partial face-contact implants are more prone to leakage than line-contact implants.

摘要

种植体-基台界面(IAI)的微生物渗漏是导致种植体周围感染的原因之一,从而使长期种植体稳定性受到威胁。本研究比较了两种类型的莫氏锥度种植体在种植体愈合基台界面的密封性能。使用两种定量种植体渗漏测量技术,即空气注射压力测量试验和微生物检查,对三种种植体系统进行了体外分析。一种内部开发的设备用于通过记录通过种植体注射空气时初始压力下降来确定种植体泄漏。微生物检查测量了接种种植体所在的培养基的吸光度。部分面接触组和线接触组之间存在显著差异(p<0.001)。两种测试都表明,部分面接触种植体比线接触种植体更容易发生渗漏。

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