Donald Danforth Plant Science Center, Saint Louis, MO, USA.
Methods Mol Biol. 2022;2539:119-132. doi: 10.1007/978-1-0716-2537-8_12.
Phenotyping specific plant traits is difficult when the samples to be measured are architecturally complex. Inflorescence and root system traits are of great biological interest, but these structures present unique phenotyping challenges due to their often complicated and three-dimensional (3D) forms. We describe how a large industrial scale X-ray tomography (XRT) instrument can be used to scan architecturally complex plant structures for the goal of rapid and accurate measurement of traits that are otherwise cumbersome or not possible to capture by other means. The combination of a large imaging cabinet that can accommodate a wide range of sample size geometries and a variable microfocus reflection X-ray source allows noninvasive X-ray imaging and 3D volume generation of diverse sample types. Specific sample fixturing (mounting) and scanning conditions are presented. These techniques can be moderate to high throughput and still provide unprecedented levels of accuracy and information content in the 3D volume data they generate.
当需要测量的样本具有复杂的结构时，对特定植物性状进行表型分析是很困难的。花序和根系性状具有重要的生物学意义，但由于它们通常具有复杂的三维（3D）形态，因此这些结构提出了独特的表型分析挑战。我们描述了如何使用大型工业规模的 X 射线断层扫描（XRT）仪器来扫描具有复杂结构的植物结构，以便快速准确地测量其他方法难以或不可能捕捉到的性状。大容量成像箱可容纳各种尺寸的样本，且配备可变微焦反射 X 射线源，这一组合使得非侵入式 X 射线成像和各种样本类型的 3D 体积生成成为可能。我们提出了具体的样本固定（安装）和扫描条件。这些技术具有中等到高通量的特点，在生成的 3D 体积数据中仍能提供前所未有的准确性和信息量。
