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作为p型透明导电氧化物的超薄SnNiO薄膜及其在发光二极管中的应用。

Thin SnNiO Films as p-Type Transparent Conducting Oxide and Their Application in Light-Emitting Diodes.

作者信息

Gagrani Nikita, Vora Kaushal, Jagadish Chennupati, Tan Hark Hoe

出版信息

ACS Appl Mater Interfaces. 2022 Aug 17;14(32):37101-37109. doi: 10.1021/acsami.2c04890. Epub 2022 Aug 2.

Abstract

The development of good-quality p-type transparent conducting oxides (TCOs) is essential to realize the full potential of TCOs for transparent electronics. This study investigates various optical and electrical properties of SnNiO under different deposition conditions to achieve high-performance p-type TCOs. We found that a film with 20% O/Ar deposited at room temperature exhibits the highest p-type conductivity with a carrier concentration of 2.04 × 10 cm, a resistivity of 14.01 Ωcm, and a Hall mobility of 7.7 cm V S. We also studied the elemental properties of a SnNiO film and the band alignment at the SnNiO/InP interface and found reasonably large values of the conduction band offset (CBO) and valence band offset (VBO). Finally, we demonstrate stable light-emitting diodes (LEDs) with n-InP nanowires (NWs) conformably coated with a p-SnNiO structure. Several films and devices were fabricated and tested over a span of 6 months, and we observed similar characteristics. This confirms the stability and reliability of the films as well as the reproducibility of the LEDs. We also investigated the temperature-dependent behavior of these LEDs and observed an additional peak due to a zinc blende/wurtzite (ZB/WZ) transition at the InP substrate and NW interface at ∼98 K and below. This study provides promising results of SnNiO as a potential p-type TCO candidate for applications in electronics and optoelectronics.

摘要

高质量p型透明导电氧化物(TCO)的开发对于充分发挥TCO在透明电子学中的潜力至关重要。本研究调查了不同沉积条件下SnNiO的各种光学和电学性质,以实现高性能p型TCO。我们发现,在室温下沉积的O/Ar含量为20%的薄膜表现出最高的p型导电性,其载流子浓度为2.04×10 cm,电阻率为14.01Ωcm,霍尔迁移率为7.7 cm V S。我们还研究了SnNiO薄膜的元素性质以及SnNiO/InP界面处的能带排列,发现导带偏移(CBO)和价带偏移(VBO)的值相当大。最后,我们展示了具有p-SnNiO结构的n-InP纳米线(NW)共形涂层的稳定发光二极管(LED)。在6个月的时间里制作并测试了几种薄膜和器件,我们观察到了相似的特性。这证实了薄膜的稳定性和可靠性以及LED的可重复性。我们还研究了这些LED的温度依赖性行为,并在约98 K及以下的InP衬底和NW界面处观察到由于闪锌矿/纤锌矿(ZB/WZ)转变而产生的额外峰值。本研究为SnNiO作为电子学和光电子学应用中潜在的p型TCO候选材料提供了有希望的结果。

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