Zhao Jiangtao, Xu Wenhui, Yi Jianji, Wang Bingyang, Zhang Fucai
Shenzhen Key Laboratory of Robotics Perception and Intelligence, and the Department of Electrical and Electronic Engineering, Southern University of Science and Technology, 1088 Xueyuan Avenue, Shenzhen 518055, China.
Shenzhen Key Laboratory of Robotics Perception and Intelligence, and the Department of Electrical and Electronic Engineering, Southern University of Science and Technology, 1088 Xueyuan Avenue, Shenzhen 518055, China.
Ultramicroscopy. 2022 Oct;240:113591. doi: 10.1016/j.ultramic.2022.113591. Epub 2022 Jul 23.
Coherent diffraction imaging (CDI) is a rapidly advancing technique, especially for imaging weakly absorptive samples with x-rays or electrons at nano or atomic resolutions. For the study of fast dynamics, single-shot imaging ability is essential. However, reconstructions provided by current single-shot CDI methods are subject to the impairment of illumination artifacts. If one wants to obtain artifact-free object images, flat or well-calibrated illumination would be required. Here, we proposed an extension to coherent modulation imaging (CMI) to realize pure object function retrieval from a single sample measurement. This extension removes the restrictions on the forms of illumination and allows flexibly placing the object between the illumination aperture and the modulator. Our method has been verified in the numerical simulation and visible light experiment, and it could make CMI a practical and powerful microscopy technique.
相干衍射成像（CDI）是一种快速发展的技术，尤其适用于以纳米或原子分辨率用X射线或电子对弱吸收样品进行成像。对于快速动力学的研究，单次成像能力至关重要。然而，当前单次CDI方法提供的重建容易受到照明伪影的影响。如果想要获得无伪影的物体图像，则需要平坦或经过良好校准的照明。在此，我们提出了对相干调制成像（CMI）的扩展，以实现从单个样品测量中检索纯物体函数。这种扩展消除了对照明形式的限制，并允许将物体灵活地放置在照明孔径和调制器之间。我们通过数值模拟和可见光实验验证了该方法，它可以使CMI成为一种实用且强大的显微镜技术。
