Zhao Benhui, Deng Yueqing, Cao Lei, Zhu Jichun, Zhou Zhengji
Miami College of Henan University, Kaifeng, China.
Key Lab for Special Functional Materials, Ministry of Education, National and Local Joint Engineering Research Center for High-Efficiency Display and Lighting Technology, and School of Materials, Henan University, Kaifeng, China.
Front Chem. 2022 Aug 9;10:974761. doi: 10.3389/fchem.2022.974761. eCollection 2022.
Kesterite-structured CuZnSn(S,Se) (CZTSSe) thin film photovoltaics have attracted considerable attention in recent years because of its low-cost and eco-friendly raw material, as well as high theoretical conversion efficiency. However, its photovoltaic performance is hindered by large open-circuit voltage ( ) deficiency due to the presence of intrinsic defects and defect clusters in the bulk of CZTSSe absorber films. The doping of extrinsic cation to the CZTSSe matrix was adopted as an effective strategy to ameliorate defect properties of the solar cell absorbers. Herein, a novel Se&SbSe co-selenization process was employed to introduce Sb into CZTSSe crystal lattice. The results reveal that Sb-doping plays an active role in the crystallization and grain growth of CZTSSe absorber layer. More importantly, one of the most seriously detrimental Sn deep defect is effectively passivated, resulting in significantly reduced deep-level traps and band-tail states compared to Sb free devices. As a result, the power conversion efficiency of CZTSSe solar cell is increased significantly from 9.17% to 11.75%, with a especially enlarged to 505 mV from 449 mV. This insight provides a deeper understanding for engineering the harmful Sn-related deep defects for future high-efficiency CZTSSe photovoltaic devices.
近年来,类纤锌矿结构的CuZnSn(S,Se)(CZTSSe)薄膜光伏器件因其低成本、环保的原材料以及较高的理论转换效率而备受关注。然而,由于CZTSSe吸收层本体中存在本征缺陷和缺陷团簇,其光伏性能受到开路电压( )大幅不足的阻碍。将外来阳离子掺杂到CZTSSe基体中是改善太阳能电池吸收体缺陷特性的有效策略。在此,采用一种新型的Se&SbSe共硒化工艺将Sb引入CZTSSe晶格。结果表明,Sb掺杂对CZTSSe吸收层的结晶和晶粒生长起到积极作用。更重要的是,最严重的有害Sn深缺陷之一得到有效钝化,与无Sb器件相比,深能级陷阱和带尾态显著减少。结果,CZTSSe太阳能电池的功率转换效率从9.17%显著提高到11.75%,开路电压尤其从449 mV增大到505 mV。这一见解为未来高效CZTSSe光电器件中与有害Sn相关的深缺陷工程提供了更深入的理解。