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用于监测植入式电极的跨通道阻抗测量。

Cross-Channel Impedance Measurement for Monitoring Implanted Electrodes.

出版信息

Annu Int Conf IEEE Eng Med Biol Soc. 2022 Jul;2022:4880-4883. doi: 10.1109/EMBC48229.2022.9871954.

Abstract

Implanted electrodes, such as those used for cochlear implants, brain-computer interfaces, and prosthetic limbs, rely on particular electrical conditions for optimal operation. Measurements of electrical impedance can be a diagnostic tool to monitor implanted electrodes for changing conditions arising from glial scarring, encapsulation, and shorted or broken wires. Such measurements provide information about the electrical impedance between a single electrode and its electrical reference, but offer no insights into the overall network of impedances between electrodes. Other solutions generally rely on geometrical assumptions of the arrangement of the electrodes and may not generalize to other electrode networks. Here, we propose a linear algebra-based approach, Cross-Channel Impedance Measurement (CCIM), for measuring a network of impedances between electrodes which all share a common electrical reference. This is accomplished by measuring the voltage response from all electrodes to a known current applied between each electrode and the shared reference, and is agnostic to the number and arrangement of electrodes. The approach is validated using a simulated 8-electrode network, demonstrating direct impedance measurements between electrodes and the reference with 96.6% ±0.2% accuracy, and cross-channel impedance measurements with 93.3% ±0.6% accuracy in a typical system. Subsequent analyses on randomized systems demonstrate the sensitivity of the model to impedance range and measurement noise. Clinical Relevance- CCIM provides a system-agnostic diagnostic test for implanted electrode networks, which may aid in the longitudinal tracking of electrode performance and early identification of electronics failures.

摘要

植入式电极,如用于人工耳蜗植入、脑机接口和假肢的电极,依赖于特定的电条件以实现最佳运行。电阻抗测量可以作为一种诊断工具,用于监测因神经胶质瘢痕形成、包裹和短路或断线而导致的植入电极变化的情况。这些测量提供了单个电极与其电参考之间的电阻抗信息,但不能提供电极之间整体阻抗网络的任何见解。其他解决方案通常依赖于电极排列的几何假设,并且可能不适用于其他电极网络。在这里,我们提出了一种基于线性代数的方法,即交叉通道阻抗测量 (CCIM),用于测量所有共享公共电参考的电极之间的阻抗网络。这是通过测量所有电极对施加在每个电极和共享参考之间的已知电流的电压响应来实现的,并且与电极的数量和排列无关。该方法使用模拟的 8 电极网络进行了验证,在典型系统中,直接电极与参考之间的阻抗测量具有 96.6%±0.2%的精度,交叉通道阻抗测量具有 93.3%±0.6%的精度。对随机系统的后续分析表明,该模型对阻抗范围和测量噪声具有敏感性。临床相关性 - CCIM 为植入式电极网络提供了一种与系统无关的诊断测试,这可能有助于电极性能的纵向跟踪和电子故障的早期识别。

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